MCDM Applications on Effective Project Management for New Wafer Fab Construction

  • Mei-Chen Lo
  • Gwo-Hshiung Tzeng
Conference paper
Part of the Smart Innovation, Systems and Technologies book series (SIST, volume 10)


This paper presents a multicriteria analysis approach for finding a route of evaluation on construction project in semiconductor manufacturing fabrication (fab). The Analytic Hierarchy Process (AHP) method is used to determine the weights for evaluation criteria among decision makers, including fab construction team, users and top management. The subjectivity and vagueness in the categorization process is dealt with by using fuzzy numbers for linguistic terms. This empirical study orients a project management on design change requirement (DCR) during construction a new wafer fab in Taiwan, and illustrates the effectiveness of the proposed approach. This study provides empirical evidence on project management effectiveness with the intent of contributing to a better understanding and improvement of project management practices. It looks into the causes of DCR and then provides possible solutions to minimize the occurrence of the DCR in the future fab construction project.


Performance Evaluation Analytic Hierarchy Process (AHP) Multiple Criteria Decision Making (MCDM) Design Change Requirement (DCR) Wafer fab Semiconductor 


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Copyright information

© Springer-Verlag Berlin Heidelberg 2011

Authors and Affiliations

  • Mei-Chen Lo
    • 1
    • 2
  • Gwo-Hshiung Tzeng
    • 2
  1. 1.Department of Business ManagementNational United UniversityMiaoliTaiwan
  2. 2.Institute of Project ManagementKainan UniversityLuchuTaiwan

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