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Single Image Example-Based Super-Resolution Using Cross-Scale Patch Matching and Markov Random Field Modelling

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Image Analysis and Recognition (ICIAR 2011)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 6753))

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Abstract

Example-based super-resolution has become increasingly popular over the last few years for its ability to overcome the limitations of classical multi-frame approach. In this paper we present a new example-based method that uses the input low-resolution image itself as a search space for high-resolution patches by exploiting self-similarity across different resolution scales. Found examples are combined in a high-resolution image by the means of Markov Random Field modelling that forces their global agreement. Additionally, we apply back-projection and steering kernel regression as post-processing techniques. In this way, we are able to produce sharp and artefact-free results that are comparable or better than standard interpolation and state-of-the-art super-resolution techniques.

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Ružić, T., Luong, H.Q., Pižurica, A., Philips, W. (2011). Single Image Example-Based Super-Resolution Using Cross-Scale Patch Matching and Markov Random Field Modelling. In: Kamel, M., Campilho, A. (eds) Image Analysis and Recognition. ICIAR 2011. Lecture Notes in Computer Science, vol 6753. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-21593-3_2

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  • DOI: https://doi.org/10.1007/978-3-642-21593-3_2

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-21592-6

  • Online ISBN: 978-3-642-21593-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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