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Reliability Prediction Handbooks: Evaluation of the System Failure Rate

  • Massimo Lazzaroni
  • Loredana Cristaldi
  • Lorenzo Peretto
  • Paola Rinaldi
  • Marcantonio Catelani
Chapter

Abstract

The evaluation of the failure rates for device, components and systems is often a very difficult task. In order to simplify the failure rate evaluation for established electronic and electromechanical devices, it is possible to use ad hoc handbooks. In fact, values for failure rates are given for many devices in the failure rate handbooks. In this chapter an historical overview on these handbooks is given. Many handbooks are available where the laws on dependency of the failure rate on different stresses are considered. In 5.1 a brief introduction about the first generation handbooks is given. In 5.2 the second generation handbooks are presented. A USA military handbooks is presented in the next 5.3, 5.4 and 5.5 are devoted to Farada and third generation handbook respectively. In 5.6 example of failure rate evaluation are discussed. Finally, the units for failure rate, the FIT, is introduced in 5.7.

Keywords

Failure Rate Electromechanical Device British Telecom Bridge Rectifier Military Environment 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    Birolini, A.: Reliability Engineering – Theory and Practice. Springer, Heidelberg, ISBN: 978-3-642-14951-1Google Scholar
  2. 2.
    U.S.A. Department of Defense, MIL-HDBK-217F Military Handbook Reliability Prediction of Electronic Equipment (and later versions) (1991)Google Scholar
  3. 3.
    IEEE Std, IEEE Guide for Selecting and Using Reliability Prediction Based on IEEE 1413 (February 19, 2003)Google Scholar
  4. 4.
    U.S.A. Department of Defense, MIL-HDBK-781 Military Handbook for Reliability Test Methods, Plans, and Environments for Engineering, Development, Qualification, and Production - Revision DGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2011

Authors and Affiliations

  • Massimo Lazzaroni
    • Loredana Cristaldi
      • Lorenzo Peretto
        • Paola Rinaldi
          • Marcantonio Catelani

            There are no affiliations available

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