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Angle-Resolved Surface-Enhanced Raman Scattering

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Raman Spectroscopy for Nanomaterials Characterization

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Acknowledgments

This research was supported by the Chinese University of Hong Kong (CUHK) through the RGC Competitive Earmarked Research Grants (402807, 402908, and 403308) and the Shun Hing Institute of Advanced Engineering (BME-p2-08). The authors thank D.Y. Lei, A.I. Fernández-Domínguez, and S.A. Maier from Imperial College, London, and J.T.K. Wan and P.M. Hui from CUHK for valuable discussions.

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Authors and Affiliations

  1. Department of Physics, The Chinese University of Hong Kong, Shatin, NT, Hong Kong

    C. Y. Chan, J. Li & H. C. Ong

  2. Department of Electronic Engineering, The Chinese University of Hong Kong, Shatin, NT, Hong Kong

    J. B. Xu

  3. School of Biomedical Sciences, The Chinese University of Hong Kong, Shatin, NT, Hong Kong

    Mary M. Y. Waye

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  1. C. Y. Chan
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  2. J. Li
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  3. H. C. Ong
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  4. J. B. Xu
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Editors and Affiliations

  1. Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA

    Challa S. S. R. Kumar

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Chan, C.Y., Li, J., Ong, H.C., Xu, J.B., Waye, M.M.Y. (2012). Angle-Resolved Surface-Enhanced Raman Scattering. In: Kumar, C.S.S.R. (eds) Raman Spectroscopy for Nanomaterials Characterization. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20620-7_1

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