Abstract
Electrostatic force microscopes (EFM) and magnetic force microscopes (MFM) are very important tools for the investigation of electric and magnetic properties at the nanometer scale. Basically these measurement instruments are atomic force microscopes (AFM) which operate in a non-contact mode. In this operating mode if some requirements for the measurement setup are fulfilled, the electrostatic and the magnetic force, respectively, become the main interaction between the sharp tip and a sample surface. In this chapter we discuss concepts for modelling EFMs and MFMs and consider some numerical aspects of solving the descriptive equations of these models. Moreover some numerical results are presented.
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Mathis, W., Preisner, T., Bala, U.B. (2011). Numerical Modelling and Simulation of Atomic Force Microscopes. In: Stephan, E., Wriggers, P. (eds) Modelling, Simulation and Software Concepts for Scientific-Technological Problems. Lecture Notes in Applied and Computational Mechanics, vol 57. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20490-6_6
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DOI: https://doi.org/10.1007/978-3-642-20490-6_6
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