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Fabrication and Characterization in the Micro-Nano Range pp 151–170Cite as

Submicron Tomography Using High Energy Synchrotron Radiation

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Part of the book series: Advanced Structured Materials ((STRUCTMAT,volume 10))

Abstract

Development of synchrotron tomography at the end of the 20th century and the following improvements in radiation source, X-ray detectors as well as X-ray optics boosted the application of the tomographic technique in materials science. It became possible for the first time to reveal the three dimensional structure of heterogeneous materials with sub-micrometer spatial resolution, the length scale where the basic mechanisms of plastic deformation and damage are taking place and determine the macroscopic behavior of engineering components. The present chapter introduces the basic features of the tomographic method developed at synchrotron sources, related mainly to the high flux and lateral coherence of the beam. These allow performing high resolution tomographic scans within a reasonable time, but also to use the optical phase of the transmitted X-ray beam to increase the sensitivity by revealing the spatial distribution of electron density. After the introduction of the technique several application examples in the field of materials science are presented.

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Acknowledgments

The electron microscopy images were obtained at the University Service for Transmission Electron Microscopy (USTEM) of the Vienna University of Technology.

Author information

Authors and Affiliations

  1. MPM Department, SMS Center, École des Mines de Saint-Étienne, 158 cours Fauriel, 42023, Saint-Étienne cedex 2, France

    András Borbély

  2. European Synchrotron Radiation Facility (ESRF), 38043, Grenoble, France

    Peter Cloetens

  3. Matériaux Ingénierie Science MATEIS, INSA de Lyon, 69621, Villeurbanne, France

    Eric Maire

  4. Institute of Materials Science and Technology, Vienna University of Technology, Karlsplatz 13/308, Vienna, Austria

    Guillermo Requena

Authors
  1. András Borbély
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  2. Peter Cloetens
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  3. Eric Maire
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  4. Guillermo Requena
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Corresponding author

Correspondence to András Borbély .

Editor information

Editors and Affiliations

  1. Andalusian Foundation for Aerospace Deve, Center for Advanced Aerospace Technologi, Seville, Spain

    Fernando A. Lasagni

  2. Fraunhofer Institute for Material and Be, Dresden, Germany

    Andrés F. Lasagni

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Borbély, A., Cloetens, P., Maire, E., Requena, G. (2011). Submicron Tomography Using High Energy Synchrotron Radiation. In: Lasagni, F., Lasagni, A. (eds) Fabrication and Characterization in the Micro-Nano Range. Advanced Structured Materials, vol 10. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-17782-8_7

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