Skip to main content

Abstract

ElectroMagnetic (EM) radiations of Integrated Circuits (IC) is for many years a main problem from an ElectroMagnetic Compatibility (EMC) point-of-view. But with the increasing use of secure embedded systems, and the apparition of new attacks based on the exploitation of physical leakages of such secure ICs, it is now also a critical problem for secure IC designers. Indeed, EM radiations of an IC, and more precisely the magnetic component, can be exploited to retrieve sensible data such as, the secret key of cryptographic algorithms. Within this context, this paper aims at introducing a magnetic field simulation flow allowing predicting, with high spatial and time resolutions, the magnetic radiations of IC cores. Such a flow being mandatory to predict the robustness of secure ICs before fabrication against EM attacks.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Technical Specification IEC 62014-1 (2001)

    Google Scholar 

  2. Technical Specification IEC 62014-3 (2002)

    Google Scholar 

  3. Technical Specification IEC 62404 (2007)

    Google Scholar 

  4. CST Studio suite, http://www.cst.com

  5. Gandolfi, K., Mourtel, C., Olivier, F.: Electromagnetic Analysis, Concrete Results. In: Koç, Ç.K., Naccache, D., Paar, C. (eds.) CHES 2001. LNCS, vol. 2162, pp. 251–261. Springer, Heidelberg (2001)

    Chapter  Google Scholar 

  6. Technical Specification IEC 61967-3

    Google Scholar 

  7. Ordas, T., Lisart, M., Sicard, E., Maurine, P., Torres, L.: Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits. In: Svensson, L., Monteiro, J. (eds.) PATMOS 2008. LNCS, vol. 5349, pp. 229–236. Springer, Heidelberg (2009)

    Chapter  Google Scholar 

  8. Sauvage, L., Guilley, S., Mathieu, Y.: Electromagnetic Radiations of FPGAs, High Spatial Resolution Cartography and Attack on a Cryptographic Module. ACM Transactions on Reconfigurable Technology and Systems (TRETS) 2(1) (2009)

    Google Scholar 

  9. Real, D., Valette, F., Drissi, M.: Enhancing correlation electromagnetic attack using planar near-field cartography. In: International Conference on Design, Automation and Test in Europe (DATE), pp. 628–633 (2009)

    Google Scholar 

  10. Dehbaoui, A., Lomne, V., Maurine, P., Torres, L., Robert, M.: Enhancing Electromagnetic Attacks using Spectral Coherence based Cartography. In: International Conference on Very Large Scale Integration, VLSI-SoC (2009)

    Google Scholar 

  11. Apache Design Solutions, http://www.apache-da.com

  12. Ben Dhia, S., Randani, M., Sicard, E.: Electromagnetic Compatibilty of Integrated Circuits: Techniques for Low Emissions and Susceptibility. Springer Science, Heidelberg (2006)

    Book  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2011 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Lomné, V., Maurine, P., Torres, L., Ordas, T., Lisart, M., Toublanc, J. (2011). Modeling Time Domain Magnetic Emissions of ICs. In: van Leuken, R., Sicard, G. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation. PATMOS 2010. Lecture Notes in Computer Science, vol 6448. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-17752-1_24

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-17752-1_24

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-17751-4

  • Online ISBN: 978-3-642-17752-1

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics