Microscopic Approach to Evaluating Technological Convergence Using Patent Citation Analysis

  • Kihoon Sung
  • Taehan Kim
  • Hee-kyung Kong
Part of the Communications in Computer and Information Science book series (CCIS, volume 124)


Technological convergence has been an important source of technological innovation in industries. We take a microscopic approach to the question for measuring and evaluating the level of technological convergence using patent citation analysis. We develop a convergence indicator that shows the relative convergence degree of a patent. This indicator is based on the backward and forward patent citations that could assess the extent of the level of convergence or originality. In this paper, we test the method that could evaluate the relative level of convergence in individual patents.


Technological Convergence Convergence Indicator Patent Citation Analysis 


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Copyright information

© Springer-Verlag Berlin Heidelberg 2010

Authors and Affiliations

  • Kihoon Sung
    • 1
  • Taehan Kim
    • 2
  • Hee-kyung Kong
    • 2
  1. 1.Department of Information and Communications Technology ManagementUniversity of Science and TechnologyDaejeonRepublic of Korea
  2. 2.Technology Strategy Research DivisionEletronics and Telecommunications Research InstituteDaejeonRepublic of Korea

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