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Microscopic Approach to Evaluating Technological Convergence Using Patent Citation Analysis

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U- and E-Service, Science and Technology (UNESST 2010)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 124))

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Abstract

Technological convergence has been an important source of technological innovation in industries. We take a microscopic approach to the question for measuring and evaluating the level of technological convergence using patent citation analysis. We develop a convergence indicator that shows the relative convergence degree of a patent. This indicator is based on the backward and forward patent citations that could assess the extent of the level of convergence or originality. In this paper, we test the method that could evaluate the relative level of convergence in individual patents.

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© 2010 Springer-Verlag Berlin Heidelberg

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Sung, K., Kim, T., Kong, Hk. (2010). Microscopic Approach to Evaluating Technological Convergence Using Patent Citation Analysis. In: Kim, Th., Ma, J., Fang, Wc., Park, B., Kang, BH., Ślęzak, D. (eds) U- and E-Service, Science and Technology. UNESST 2010. Communications in Computer and Information Science, vol 124. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-17644-9_21

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  • DOI: https://doi.org/10.1007/978-3-642-17644-9_21

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-17643-2

  • Online ISBN: 978-3-642-17644-9

  • eBook Packages: Computer ScienceComputer Science (R0)

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