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Analytical Chemistry

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Springer Handbook of Metrology and Testing

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Abstract

Measurements of the chemical compositions of materials and the levels of certain substances in them are vital when assessing and improving public health, safety and the environment, are necessary to ensure trade equity, and are required when monitoring and improving industrial products and services. Chemical measurements play a crucial role in most areas of the economy, including healthcare, food and nutrition, agriculture, environmental technologies, chemicals and materials, instrumentation, electronics, forensics, energy, and transportation.

This chapter presents a broad overview of the analytical techniques that can be used to perform the higher order chemical characterization of materials. Techniques covered include mass spectrometry, molecular spectrometry, atomic spectrometry, nuclear analytical methods, chromatographic methods and classical chemical methods.

For each technique, information is provided on the principle(s) of operation, the scope of the technique, the nature of the sample that can be used, qualitative analysis, traceable quantitative analysis, and key references. Examples of representative data are provided for each technique, where possible.

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Abbreviations

AAS:

atomic absorption spectrometry

AED:

atomic emission detector

AEM:

analytical electron microscopy

AES:

Auger electron spectroscopy

APCI:

atmospheric pressure chemical ionization

ASTM:

American Society for Testing and Materials

ATR:

attenuated total reflection

BAM:

Federal Institute for Materials Research and Testing, Germany

BLRF:

bispectral luminescence radiance factor

CCD:

charge-coupled device

CCQM:

Comité Consultative pour la Quantité de Matière

CCQM:

Consultative Committee for Quantity of Matter Metrology in Chemistry

CE:

Communauté Européenne

CE:

Conformité Européenne

CE:

capillary electrophoresis

CE:

counter electrode

CGE:

capillary gel electrophoresis

CGHE:

carrier gas hot extraction

CIEF:

capillary isoelectric focusing

CITP:

capillary isotachophoresis

CMA:

cylindrical mirror analyzer

CPAA:

charged particle activation analysis

CRM:

certified reference material

CTD:

charge transfer device

CVD:

chemical vapor deposition

CW:

continuous wave

CZE:

capillary zone electrophoresis

DC:

direct current

EC:

electrochemical

ECD:

electron capture detector

EDS:

energy-dispersive spectrometer

EELS:

electron energy-loss spectroscopy

ELSD:

evaporative light scattering detection

EPMA:

electron probe microanalysis

EPR:

electron paramagnetic resonance

ESEM:

environmental scanning electron microscope

ESI:

electrospray ionization

FIB:

focused ion beam

FID:

free induction decay

FL:

Fermi level

FNAA:

fast neutron activation analysis

FPD:

flame photometric detector

FT:

Fourier transform

GC:

gas chromatography

GD-MS:

glow discharge mass spectrometry

GSED:

gaseous secondary electron detector

GUM:

Glowny-Urzad-Miar

GUM:

guide to the expression of uncertainty in measurement

HPLC:

high-performance liquid chromatography

HSA:

hemispherical analyzer

ICP:

inductively coupled plasma

ICR:

ion cyclotron resonance

INAA:

instrumental NAA

IR:

infrared

ISO:

International Organization for Standardization

LC:

liquid chromatography

LC:

liquid crystal

LED:

light-emitting diode

MDM:

minimum detectable mass

MECC:

micellar electrokinetic capillary chromatography

MLLSQ:

multiple linear least squares

MMF:

minimum mass fraction

MS:

magnetic stirring

MS:

mass spectrometry

NAA:

neutron activation analysis

NDP:

neutron depth profiling

NIR:

near infrared

NIST:

National Institute of Standards and Technology

NMI:

National Metrology Institute

NMR:

nuclear magnetic resonance

ODS:

octadecylsilane

OES:

optical emission spectroscopy/spectrometry

PAA:

photon activation analysis

PAH:

polycyclic aromatic hydrocarbon

PGAA:

prompt gamma activation analysis

PID:

photoionization detector

PIXE:

particle-induced x-ray emission

PMT:

photomultiplier tube

PTB:

Physikalisch-Technische Bundesanstalt

PTFE:

polytetrafluoroethylene

QNMR:

quantitative proton nuclear magnetic resonance

RF:

radiofrequency

RI:

refractive index

RNA:

nuclear reaction analysis

RNAA:

radiochemical NAA

RPLC:

reversed-phase liquid chromatography

RSF:

relative sensitivity factor

S/N:

signal-to-noise ratio

SDD:

silicon drift detector

SE:

secondary electron

SEM:

scanning electron microscopy

SI:

International System of Units

SI:

Système International dʼUnités

SIMS:

secondary ion mass spectrometry

SRE:

stray radiant energy

SRM:

standard reference material

STEM:

scanning transmission electron microscopy

TCD:

thermal conductivity detector

TEM:

transmission electron microscopy

TIMS:

thermal ionization mass spectrometry

TMS:

tetramethylsilane

TOF:

time of flight

UHV:

ultra-high vacuum

UV:

ultraviolet

UVSG:

UV Spectrometry Group

VG:

vortex glass

WDS:

wavelength-dispersive spectrometry

XEDS:

energy-dispersive x-ray spectrometry

XRF:

x-ray fluorescence

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Authors and Affiliations

  1. Chemical Science and Technology Laboratory (CSTL), National Institute of Standards and Technology (NIST), 100 Bureau Drive, MS 8300, 20899, Gaithersburg, MD, USA

    Willie E. May Dr.

  2. Surface and Microanalysis Science Division, Chemical Science and Technology Laboratory (CSTL), National Institute of Standards and Technology (NIST), 100 Bureau Drive, MS 8371, 20899, Gaithersburg, MD, USA

    Richard R. Cavanagh Dr.

  3. Analytical Chemistry Division, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8391, 20899, Gaithersburg, MD, USA

    Gregory C. Turk Dr.

  4. Analytical Chemistry Division, National Institute of Standards and Technology, 100 Bureau Drive, Building 227, Mailstop 8391, 20899, Gaithersburg, MD, USA

    Michael Winchester Dr.

  5. Analytical Chemistry Division (Retired), National Institute of Standards and Technology, 100 Bureau Drive, MS 8312, 20899-8312, Gaithersburg, MD, USA

    John Travis Ph.D.

  6. Biospectroscopy Group, National Institute of Standards and Technology, 100 Bureau Drive, 20899-8312, Gaithersburg, MD, USA

    Melody V. Smith

  7. Biochemical Science Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8312, 20899-8312, Gaithersburg, MD, USA

    Paul DeRose Ph.D.

  8. Biochemical Science Division, National Institute of Standards and Technology, 100 Bureau Dr., MS 8312, 20899-8312, Gaithersburg, MD, USA

    Steven J. Choquette Ph.D.

  9. Biospectroscopy Group, Biochemical Science Division, National Institute of Standards and Technology, 100 Bureau Drive, 20899-8312, Gaithersburg, MD, USA

    Gary W. Kramer Ph.D.

  10. Chemical Science and Technology Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8391, 20899, Gaithersburg, MD, USA

    John R. Sieber Dr.

  11. Analytical Chemistry Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8395, 20899-8395, Gaithersburg, MD, USA

    Robert R. Greenberg Dr.

  12. Analytical Chemistry Division, National Institute of Standards and Technology, 100 Bureau Drive, 20899-8392, Gaithersburg, MD, USA

    Richard Lindstrom

  13. Analytical Chemistry Division, National Institute of Standards and Technology, 100 Bureau Dr. Stop 8395, 20899, Gaithersburg, MD, USA

    George Lamaze Dr.

  14. Analytical Chemistry Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8395, 20899-8395, Gaithersburg, MD, USA

    Rolf Zeisler Dr.

  15. Analytical Chemistry Division, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8392, 20899, Gaithersburg, MD, USA

    Michele Schantz Dr.

  16. Chemical Science and Technology Laboratory, Analytical Chemistry Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8392, 20899-8392, Gaithersburg, MD, USA

    Lane Sander Ph.D.

  17. Analytical Chemistry Division, National Institute of Standards and Technology, 100 Bureau Drive, Stop 8392, 20899-8392, Gaithersburg, MD, USA

    Karen W. Phinney Ph.D.

  18. National Institute of Standards and Technology, 100 Bureau Drive, Stop 8392, 20899, Gaithersburg, MD, USA

    Michael Welch Dr.

  19. Analytical Chemistry Division, National Institute of Standards and Technology (NIST), 100 Bureau Dr. Stop 8391, 20899-8391, Gaithersburg, MD, USA

    Thomas Vetter

  20. Analytical Chemistry Division, National Institute of Standards and Technology, 100 Bureau Dr., Stop 8391, 20899-8391, Gaithersburg, MD, USA

    Kenneth W. Pratt Dr.

  21. Surface and Microanalysis Science Division, National Institute of Standards and Technology, 100 Bureau Drive, 20899-8392, Gaithersburg, MD, USA

    John H. J. Scott

  22. Surface and Microanalysis Science Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8370, 20899, Gaithersburg, MD, USA

    John Small

  23. Surface and Microanalysis Science Division, National Insitute of Standards and Technology, 100 Bureau Drive, Stop 8371, 20899-8371, Gaithersburg, MD, USA

    Scott Wight B.S.

  24. Department of Commerce, Surface and Microanalysis Science Division, National Institute of Standards and Technology, 100 Bureau Dr., 20899-8372, Gaithersburg, MD, USA

    Stephan J. Stranick Ph.D.

  25. Püttbergeweg 23, 12589, Berlin, Germany

    Ralf Matschat

  26. Treppendorfer Weg 33, 12527, Berlin, Germany

    Peter Reich

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  1. Willie E. May Dr.
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Corresponding authors

Correspondence to Willie E. May Dr. , Richard R. Cavanagh Dr. , Gregory C. Turk Dr. , Michael Winchester Dr. , John Travis Ph.D. , Melody V. Smith , Paul DeRose Ph.D. , Steven J. Choquette Ph.D. , Gary W. Kramer Ph.D. , John R. Sieber Dr. , Robert R. Greenberg Dr. , Richard Lindstrom , George Lamaze Dr. , Rolf Zeisler Dr. , Michele Schantz Dr. , Lane Sander Ph.D. , Karen W. Phinney Ph.D. , Michael Welch Dr. , Thomas Vetter , Kenneth W. Pratt Dr. , John H. J. Scott , John Small , Scott Wight B.S. , Stephan J. Stranick Ph.D. , Ralf Matschat or Peter Reich .

Editor information

Editors and Affiliations

  1. University of Applied Sciences Berlin, Luxemburger Strasse 10, 13353, Berlin, Germany

    Horst Czichos Prof.

  2. National Institute for Materials Science (NIMS), Tsukuba, Ibaraki, Japan

    Tetsuya Saito

  3. National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA

    Leslie Smith

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May, W.E. et al. (2011). Analytical Chemistry. In: Czichos, H., Saito, T., Smith, L. (eds) Springer Handbook of Metrology and Testing. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-16641-9_4

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