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Springer Handbook of Metrology and Testing pp 23–37Cite as

Metrology Principles and Organization

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Abstract

This chapter describes the basic elements of metrology, the system that allows measurements made in different laboratories to be confidently compared. As the aim of this chapter is to give an overview of the whole field, the development of metrology from its roots to the birth of the Metre Convention and metrology in the 21st century is given.

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Abbreviations

APMP:

Asian–Pacific Metrology Program

BAAS:

British Association for the Advancement of Science

BIPM:

Bureau International des Poids et Mesures

BIPM:

International Bureau of Weights and Measures

CC:

consultative committee

CC:

correlation coefficient

CCQM:

Comité Consultative pour la Quantité de Matière

CCQM:

Consultative Committee for Quantity of Matter Metrology in Chemistry

CGPM:

General Conference on Weights and Measures

CIPM:

Comité Internationale des Poids et Mesures

CIPM:

International Committee of Weights and Measures

CMC:

calibration and measurement capability

CMC:

ceramic matrix composite

EU:

European Union

FAA:

Federal Aviation Administration

FAA:

Federal Aviation Authority

GMO:

genetically modified organism

GUM:

Glowny-Urzad-Miar

GUM:

guide to the expression of uncertainty in measurement

IEC:

International Electrotechnical Commission

IFCC:

International Federation of Clinical Chemistry and Laboratory Medicine

ILAC:

International Laboratory Accreditation Cooperation

ILC:

interlaboratory comparison

ISO:

International Organization for Standardization

JCTLM:

Joint Committee for Traceability in Laboratory Medicine

KCDB:

key comparison database

MKS:

meter, kilogram, and second

MKSA:

meter, kilogram, second, and ampere

MRA:

multiregional agreement

MRA:

mutual recognition arrangement

NIST:

National Institute of Standards and Technology

NMI:

National Metrology Institute

NPL:

National Physical Laboratory

RM:

reference material

RMO:

regional metrology organization

SADCMET:

Southern African Development Community Cooperation in Measurement Traceability

SI:

International System of Units

SI:

Système International dʼUnités

SIM:

Sistema Interamericano de Metrología

TBT:

technical barriers to trade

VIM:

international vocabulary of basic and general terms in metrology

VIM:

international vocabulary of metrology

References

  1. Bureau international des poids et mesures (BIPM): The international system of units (SI), 7th edn. (BIPM, Sèvres 1998), see http://www.bipm.org/en/si/si_brochure

    Google Scholar 

  2. International Organization for Standardization (ISO): International vocabulary of basic and general terms in metrology (BIPM/IEC/IFCC/ISO/IUPAC/IUPAP/OIML, Genf 1993)

    Google Scholar 

  3. International Organization for Standardization (ISO): Guide to the expression of uncertainty in measurement (ISO, Genf 1993)

    Google Scholar 

  4. A.J. Wallard, T.J. Quinn: Intrinsic standards – Are they really what they claim?, Cal Lab Mag. 6(6) (1999)

    Google Scholar 

  5. Directive 98/79/EC: See http://www.bipm.org/en/committees/jc/jctlm

  6. W. Martienssen, H. Warlimont (Eds.): Springer Handbook of Condensed Matter and Materials Data (Springer, Berlin, Heidelberg 2005)

    Google Scholar 

  7. I.M. Mills, P.J. Mohr, T.J. Quinn, B.N. Taylor, E.R. Williams: Redefinition of the kilogram: A decision whose time has come, Metrologia 42(2), 71–80 (2005)

    Article  Google Scholar 

  8. http://www.sim-metrologia.org.br/docs/revista_SIM

  9. http://www.bipm.org/wg/AllowedDocuments.jsp?

  10. http://www.codata.org/index.html

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Author information

Authors and Affiliations

  1. Bureau International des Poids et Mesures, Pavillon de Breteuil, 92312, Sèvres, France

    Andrew Wallard Prof.

Authors
  1. Andrew Wallard Prof.
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Corresponding author

Correspondence to Andrew Wallard Prof. .

Editor information

Editors and Affiliations

  1. University of Applied Sciences Berlin, Luxemburger Strasse 10, 13353, Berlin, Germany

    Horst Czichos Prof.

  2. National Institute for Materials Science (NIMS), Tsukuba, Ibaraki, Japan

    Tetsuya Saito

  3. National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA

    Leslie Smith

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© 2011 Springer-Verlag

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Wallard, A. (2011). Metrology Principles and Organization. In: Czichos, H., Saito, T., Smith, L. (eds) Springer Handbook of Metrology and Testing. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-16641-9_2

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