Measuring the Quality of Shifting and Scaling Patterns in Biclusters

  • Beatriz Pontes
  • Raúl Giráldez
  • Jesús S. Aguilar-Ruiz
Part of the Lecture Notes in Computer Science book series (LNCS, volume 6282)

Abstract

The most widespread biclustering algorithms use the Mean Squared Residue (MSR) as measure for assessing the quality of biclusters. MSR can identify correctly shifting patterns, but fails at discovering biclusters presenting scaling patterns. Virtual Error (VE) is a measure which improves the performance of MSR in this sense, since it is effective at recognizing biclusters containing shifting patters or scaling patterns as quality biclusters. However, VE presents some drawbacks when the biclusters present both kind of patterns simultaneously. In this paper, we propose a improvement of VE that can be integrated in any heuristic to discover biclusters with shifting and scaling patterns simultaneously.

Keywords

Gene Expression Data Virtual Condition Scaling Pattern Pattern Equation Combine Pattern 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2010

Authors and Affiliations

  • Beatriz Pontes
    • 1
  • Raúl Giráldez
    • 2
  • Jesús S. Aguilar-Ruiz
    • 2
  1. 1.Department of Computer ScienceUniversity of SevilleSevillaSpain
  2. 2.School of EngineeringPablo de Olavide UniversitySevillaSpain

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