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Three-Dimensional Mapping and Ranging of Objects Using Speckle Pattern Analysis

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Coherent Light Microscopy

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 46))

Abstract

In this chapter, we present two novel approaches for 3-D object shape measurement and range estimation based on digital image processing of speckle patterns. In the first one, 3-D mapping and range measurement are retrieved by projecting, through a ground glass diffuser, random speckle patterns on the object or on the camera for a transmissive and reflective configuration, respectively. Thus, the camera sensor records in time sequence different speckle patterns at different distances, and by using correlation operation between them, it is possible to achieve 3-D mapping and range finding. In the second one, the 3-D mapping and ranging are performed by sensing the visibility associated with the coherence function of a laser source used to illuminate the object. In this case, the object depth is encoded into the amplitude of the interference pattern when assembling a typical electronic speckle pattern interferometric (ESPI) layout. Thus, the 3-D object shape is reconstructed by means of a range image from the visibility of the image set of interferograms without the need for depth scanning. In both cases, we present experimental implementation validating the proposed methods.

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Author information

Authors and Affiliations

  1. Departamento de Óptica, Universitat de Valencia, 46100, Burjassot, Spain

    Vicente Micó, Pascuala García-Martínez & Carlos Ferreira

  2. School of Engineering, Bar Ilan University, Ramat Gan, 52900, Israel

    Zeev Zalevsky

  3. Departamento de Óptica, Universitat de Valencia, C/Doctor Moliner 50, 46100, Burjassot, Spain

    Javier García

  4. Department of Mathematics, Bar-Ilan University, Ramat-Gan, 52900, Israel

    Mina Teicher & Yevgeny Beiderman

  5. AIDO - Technological Institute of Optics, Color and Imaging, 46980, Paterna, Spain

    Estela Valero

Authors
  1. Vicente Micó
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  2. Zeev Zalevsky
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  3. Javier García
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  4. Mina Teicher
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  5. Yevgeny Beiderman
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  6. Estela Valero
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  7. Pascuala García-Martínez
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  8. Carlos Ferreira
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Corresponding author

Correspondence to Javier García .

Editor information

Editors and Affiliations

  1. Ist. Nazionale di Ottica Applicata, CNR, Via Campi Flegrei 34, Pozzuoli, 80078, Napoli, Italy

    Pietro Ferraro

  2. Dept. Biomedical Engineering, Duke University, Durham, 27708-0292, North Carolina, USA

    Adam Wax

  3. Dept. Engineering, Bar-Ilan University, Ramat Gan, 52900, Israel

    Zeev Zalevsky

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Micó, V. et al. (2011). Three-Dimensional Mapping and Ranging of Objects Using Speckle Pattern Analysis. In: Ferraro, P., Wax, A., Zalevsky, Z. (eds) Coherent Light Microscopy. Springer Series in Surface Sciences, vol 46. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-15813-1_13

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