Abstract
A robust technique for modelling linear and nonlinear lumped elements spanning multiple cells in an FDTD-based electromagnetic field simulator is presented. The nonlinear models require iteration as part of the model. The technique is applied to produce a highly stable LE-FDTD diode model that works well far beyond normal operational voltage ranges. Simulation results are in good agreement with those obtained with the circuit simulator APLAC and those in the literature [1].
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References
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Costa, L.J., Nikoskinen, K., Valtonen, M.: Models for the LE-FDTD resistive voltage source spanning multiple cells. In: Proceedings of the 2007 European Conference on Circuit Theory and Design, ECCTD 2007, August 26-30, pp. 671–674 (2007)
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APLAC — Circuit Simulation and Design Tool, AWR–APLAC Corporation, Finland (2008) http://www.awrcorp.com/
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Costa, L.R.J., Nikoskinen, K., Valtonen, M. (2010). A Robust Technique for Modelling Nonlinear Lumped Elements Spanning Multiple Cells in FDTD. In: Roos, J., Costa, L. (eds) Scientific Computing in Electrical Engineering SCEE 2008. Mathematics in Industry(), vol 14. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-12294-1_8
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DOI: https://doi.org/10.1007/978-3-642-12294-1_8
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