Abstract
This work presents an accurate and efficient closed form model to compute the slew metric of on-chip RC interconnects of high speed CMOS VLSI circuits. Our slew metric computation is based on the Burr’s distribution function. The Burr’s distribution is used to characterize the normalized homogeneous portion of the step response. The simulation results performed on the practical industrial nets justifies the accuracy of our approach.
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Kar, R., Maheshwari, V., Maqbool, M., Mal, A.K., Bhattacharjee, A.K. (2010). A Closed Form Slew Evaluation Approach Using Burr’s Distribution Function for High Speed On-Chip RC Interconnects. In: Das, V.V., et al. Information Processing and Management. BAIP 2010. Communications in Computer and Information Science, vol 70. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-12214-9_13
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DOI: https://doi.org/10.1007/978-3-642-12214-9_13
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-12213-2
Online ISBN: 978-3-642-12214-9
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