Abstract
This paper presents a low-power soft error-hardened latch suitable for reliable circuit operation. The proposed circuit uses redundant feedback loop to protect latch against soft error on the internal nodes, and transmission gate and Schmitt-trigger circuit to filter out transient resulting from particle hit on combinational logic. The proposed circuit has low power consumption with negative setup time and low timing overhead. The HSPICE post-layout simulation in 90nm CMOS technology reveals that circuit is able to recover from almost any single particle strike on internal nodes and tolerates input SETs up to 130ps of duration.
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Karimiyan Alidash, H., Oklobdzija, V.G. (2010). Low-Power Soft Error Hardened Latch. In: Monteiro, J., van Leuken, R. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2009. Lecture Notes in Computer Science, vol 5953. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-11802-9_30
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DOI: https://doi.org/10.1007/978-3-642-11802-9_30
Publisher Name: Springer, Berlin, Heidelberg
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