Abstract
We use Transaction Level Modeling techniques to specify and validate best-effort channels for networked embedded devices, to integrate the generated specification model in system-level design flow, for prototyping, exploration and validation of design alternatives. A best-effort channel does not provide any guarantees on final data delivery or delivery rate. With more embedded devices existing in networked environments, often sharing a common communication channel, devices compete with each other for all common network resources, e.g., in a wireless sensor network where low power devices share a low bandwidth best-effort channel. To examine such systems, we specify Half-Duplex Ethernet using the SpecC language and Transaction Level Modeling techniques. All models are validated in a multi-station test setup using Ethernet-based network algorithms.
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Banerjee, A., Gerstlauer, A. (2009). Transaction Level Modeling of Best-Effort Channels for Networked Embedded Devices. In: Rettberg, A., Zanella, M.C., Amann, M., Keckeisen, M., Rammig, F.J. (eds) Analysis, Architectures and Modelling of Embedded Systems. IESS 2009. IFIP Advances in Information and Communication Technology, vol 310. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-04284-3_8
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DOI: https://doi.org/10.1007/978-3-642-04284-3_8
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