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PhotoThermal Induced Resonance. Application to Infrared Spectromicroscopy

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Thermal Nanosystems and Nanomaterials

Part of the book series: Topics in Applied Physics ((TAP,volume 118))

Abstract

In this chapter, we shall describe a new technique for carrying out infrared spectromicroscopy at the nanoscale. This technique is based on the detection of expansion, induced by the photothermal effect, by the cantilever of an atomic force microscope (AFM). We begin by explaining the advantages of studying matter in the infrared frequency range, and the limits of conventional techniques. We then describe the underlying principles and the setup we have developed for going beyond these limits. We present a simple theoretical approach to the relevant phenomena in order to bring out the intrinsic properties of this method, and we discuss in particular the question of resolution. To end our discussion, we illustrate the potential of the PTIR technique by some experimental results.

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Acknowledgements

The following have contributed to this work: R. Prazeres, C. Mayet, F. Glotin, and J.M. Ortega of the Laboratoire de Chimie Physique, Université Paris-Sud, M. De Frutos of the Laboratoire de Physique du Solide, Université Paris-Sud, Orsay, G. Sockalingum of the Unité MéDIAN, UFR Pharmacie, Université de Reims, and D. Toubas of the Laboratoire de Parasitologie-Mycologie, CHU Reims.

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Authors and Affiliations

  1. Laboratoire de Chimie Physique, Université de Paris-Sud, Bâtiment 201 P2, 91405, Orsay Cedex, France

    Alexandre Dazzi

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  1. Alexandre Dazzi
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Correspondence to Alexandre Dazzi .

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Editors and Affiliations

  1. et Macroscopique, Laboratoire d'Energétique Moléculaire, Grande Voie des Vignes, Châtenay Malabry, 92295, France

    Sebastian Volz

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Dazzi, A. (2009). PhotoThermal Induced Resonance. Application to Infrared Spectromicroscopy. In: Volz, S. (eds) Thermal Nanosystems and Nanomaterials. Topics in Applied Physics, vol 118. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-04258-4_16

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  • DOI: https://doi.org/10.1007/978-3-642-04258-4_16

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-04257-7

  • Online ISBN: 978-3-642-04258-4

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