Abstract
The first demonstrations of photoacoustic and photothermal effects were made in the nineteenth century, but the development of photothermal techniques did not really take off until the 1970s, in particular through the work of Rozencwaig [1, 2]. Today a broad range of methods can be subsumed under this heading, with the common feature that they use light to produce a thermal excitation. By extension, other methods are included, in which a light wave is used to probe a thermal phenomenon. This chapter will be concerned with the latter, and in particular their application to microelectronic technology. Indeed, insofar as they are non-contact, and generally non-invasive, optical measurement techniques are well suited to many micro- and nanoscale heat transfer problems.
This area has long been dominated by techniques involving measurement of infrared thermal emission in the far field. With the exception of recently developed methods using the near infrared, these methods have reached their limits today because their spatial resolution is not good enough to be applicable to micro- and nanoscale heat transfer. Here we shall review the main optical techniques that have emerged recently to get around these limitations. Many of them use modulation, exploiting the excellent signal-to-noise ratios that can be obtained by lock-in methods, but also spatial confinement of the modulated part of the temperature obtained under alternating conditions.
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References
A. Rosencwaig and A. Gersho: Journal of Applied Physics 47, 64 (1976)
A. Rosencwaig, J. Opsal, W.L. Smith, et al.: Applied Physics Letters 46, 1013 (1985)
D.Y. Li, Y.Y. Wu, P. Kim, et al.: Applied Physics Letters 83, 2934 (2003)
P. Kim, L. Shi, A. Majumdar, et al.: Physical Review Letters 8721 (2001)
G. Abstreiter: Applied Surface Science 50, 73 (1991)
M. Cazzanelli, C. Vinegoni, and L. Pavesi: Journal of Applied Physics 85, 1760 (1999)
L. Pavesi and M. Guzzi: Journal of Applied Physics 75, 4779 (1994)
S. Grauby, A. Salhi, J.M. Rampnoux, et al.: Review of Scientific Instruments 78, 74902 (2007)
S. Dilhaire, D. Fournier, and G. Tessier: Microscale and Nanoscale Heat Transfer 107, 239 (2007)
G. Ghosh: Handbook of Thermo-Optic Coefficients of Optical Materials with Applications, Academic Press, New York (1998)
E.D. Palik: Journal of the Optical Society of America, Optics Image Science and Vision 1, 1297 (1984)
G. Tessier, S. Hole, and D. Fournier: Optics Letters 28, 875 (2003)
W.J. Scouler: Physical Review Letters 18, 445 (1967)
R. Rosei and D.W. Lynch: Physical Review B 5, 3883 (1972)
J. Christofferson and A. Shakouri: Review of Scientific Instruments 76 (2005)
A. Shakouri: Proceedings of the IEEE 94, 1613 (2006)
S. Grauby, B.C. Forget, S. Hole, et al.: Review of Scientific Instruments 70, 3603 (1999)
P. Gleyzes, F. Guernet, and A.C. Boccara: Journal of Optics Nouvelle Revue D Optique 26, 251 (1995)
P.M. Mayer, D. Luerssen, R.J. Ram, et al.: Journal of the Optical Society of America, Optics Image Science and Vision 24, 1156 (2007)
C. Filloy-Corbrion, G. Tessier, S. Hole, et al.: Journal de Physique IV 125, 105 (2005)
B.C. Forget, S. Grauby, D. Fournier, et al.: Electronics Letters 33, 1688 (1997)
M.G. Burzo, P.L. Komarov, and P.E. Raad: IEEE Transactions on Components and Packaging Technologies 28, 637 (2005)
M.G. Burzo, P.L. Komarov, and P.E. Raad: IEEE Transactions on Components and Packaging Technologies 28, 39 (2005)
G. Tessier, C. Filloy, M.L. Polignano, et al.: Journal de Physique IV 125, 423 (2005)
R. Abid and F. Miserey: Comptes Rendus de l’Academie des Sciences Serie II 319, 631 (1994)
R. Abid, F. Miserey, and F.Z. Mezroua: Journal de Physique III 6, 279 (1996)
V. Quintard, G. Deboy, S. Dilhaire, et al.: Microelectronic Engineering 31, 291 (1996)
G. Tessier, G. Jerosolimski, S. Hole, et al.: Review of Scientific Instruments 74, 495 (2003)
S. Hole, G. Tessier, C. Filloy, et al.: Electronics Letters 38, 986 (2002)
G. Tessier, S. Hole, and D. Fournier: Applied Physics Letters 78, 2267 (2001)
G. Bautista, C. M. Blanca, S. Delica, et al.: Optics Express 14, 1021 (2006)
L.R. de Freitas, E.C. da Silva, A.M. Mansanares, et al.: Journal of Applied Physics 98, 63508 (2005)
G. Bautista, C.M. Blanca, and C. Saloma: Applied Optics 46, 855 (2007)
O.B. Wright, R. Li Voti, O. Matsuda, et al.: Journal of Applied Physics 91, 5002 (2002)
G. Jerosolimski, V. Reita, G. Tessier, et al.: Journal de Physique IV 125, 419 (2005)
S. Dilhaire, S. Jorez, L.D. Patiño Lopez, et al.: In: Heat Transfer and Transport Phenomena in Microsystems, Banff, Canada, (2000), pp. 392–397
S. Dilhaire, S. Grauby, and W. Claeys: Applied Physics Letters 84, 822 (2004)
S. Dilhaire, S. Grauby, and W. Claeys: IEEE Electron Device Letters 26, 461 (2005)
G. Tessier, M.L. Polignano, S. Pavageau, et al.: Journal of Physics D Applied Physics 39, 4159 (2006)
V.V. Pavlov, G. Tessier, C. Malouin, et al.: Applied Physics Letters 75, 190 (1999)
G. Tessier and P. Beauvillain: Applied Surface Science 164, 175 (2000)
V.V. Pavlov, J. Ferre, P. Meyer, et al.: Journal of Physics Condensed Matter 13, 9867 (2001)
G. Tessier, A. Salhi, Y. Rouillard, et al.: Journal de Physique IV 125, 375 (2005)
G. Tessier, S. Pavageau, B. Charlot, et al.: IEEE Transactions on Components and Packaging Technologies 30, 604 (2007)
J.S. Wilson and P.E. Raad: International Journal of Heat and Mass Transfer 47, 3707 (2004)
P.E. Raad, P.L. Komarov, and M.G. Burzo: IEEE Transactions on Components and Packaging Technologies 30, 597 (2007)
L. Aigouy, G. Tessier, M. Mortier, et al.: Applied Physics Letters 87 (2005)
S. Gomes, P.O. Chapuis, E. Nepveu, et al.: IEEE Transactions on Components and Packaging Technologies 30, 424 (2007)
S.B. Ippolito, B.B. Goldberg, and M.S. Unlu: Applied Physics Letters 78, 4071 (2001)
E. Ramsay, N. Pleynet, D. Xiao, et al.: Optics Letters 30, 26 (2005)
J. Christofferson and A. Shakouri: Microelectronics Journal 35, 791 (2004)
J.M. Rampnoux, H. Michel, M.A. Salhi, et al.: Microelectronics Reliability 46, 1520 (2006)
C. Doule, T. Lepine, P. Georges, et al.: Optics Letters 25, 353 (2000)
G. Tessier, M. Bardoux, C. Boue, et al.: Applied Physics Letters 90 (2007)
H.H. Li: Journal of Physical and Chemical Reference Data 9, 561 (1980)
S.M. Mansfield and G.S. Kino: Applied Physics Letters 57, 2615 (1990)
S.B. Ippolito, B.B. Goldberg, and M.S. Unlu: Journal of Applied Physics 97 (2005)
E. Ramsay, K.A. Serrels, M.J. Thomson, et al.: Applied Physics Letters 90 (2007)
S.B. Ippolito, S.A. Thorne, M.G. Eraslan, et al.: Applied Physics Letters 84, 4529 (2004)
O. Breitenstein, F. Altmann, T. Riediger, et al.: Microelectronics Reliability 46, 1508 (2006)
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Tessier, G. (2009). Photothermal Techniques. In: Volz, S. (eds) Thermal Nanosystems and Nanomaterials. Topics in Applied Physics, vol 118. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-04258-4_13
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DOI: https://doi.org/10.1007/978-3-642-04258-4_13
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