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Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy

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Scanning Probe Microscopy in Nanoscience and Nanotechnology

Part of the book series: NanoScience and Technology ((NANO))

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Summary

As a variation of atomic/scanning force microscopy (AFM/SFM), lateral force microscopy (LFM) relies on the torsional deformation of the AFM cantilever upon lateral forces acting between tip and sample surface. LFM enables imaging of frictional properties of the surfaces of materials, thin films or monolayers at a high spatial resolution. Furthermore, LFM is increasingly used to study the effect of shear loading on nanostructures or nanoparticulates. Albeit a large variety of applications have been demonstrated and the measurement mode is implemented in most commercially available AFM instruments, LFM seems to suffer from the lack of reliable and established calibration methods for lateral forces. However, general acceptance of LFM requires quantification coupled with a solid understanding of the sources of uncertainty. This chapter reviews the available experimental calibration methods. In addition to a description of these methods, a table including information on the key characteristics is provided as well as an overview of the basic equations.

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Acknowledgements

The author would like to thank C.A. Clifford, D. Roy, and I.S. Gilmore for their helpful comments. This work is supported by the National Measurement System of the UK Department for Business, Innovation & Skills through the Chemical and Biological Metrology Programme. This article is reproduced with the permission of Her Majesty’s Stationery Office (Crown copyright, 2009).

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  1. Analytical Science Team Quality of Life Division, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK

    Martin Munz

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  1. Nanoprobe Lab. Bio- & Nanotechnology &, Ohio State University, West 19th Avenue 201, Columbus, 43210-1142, U.S.A.

    Bharat Bhushan

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Munz, M. (2010). Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy. In: Bhushan, B. (eds) Scanning Probe Microscopy in Nanoscience and Nanotechnology. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-03535-7_9

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