Skip to main content
SpringerLink
Log in
Book cover

Noncontact Atomic Force Microscopy pp 1–13Cite as

Introduction

  • Chapter
  • First Online:

Part of the book series: NanoScience and Technology ((NANO))

Abstract

Since the publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM), which can image even insulators with atomic resolution, has achieved remarkable progress. This second volume deals with the following outstanding results obtained with atomic resolution after the publication of the previous books: (1) Force Spectroscopy and Force-Mapping with Atomic Resolution, (2) Tuning Fork/qPlus Sensor, (3) Atomic Manipulation, (4) Magnetic Exchange Force Microscopy, (5) Atomic and Molecular Imaging in Liquids, (6) New Technologies in Dynamic Force Microscopy. These results and technologies are now varying the NC-AFM with imaging function on an atomic scale toward characterization and manipulation tools of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the NC-AFM is now becoming a crucial tool for nanoscience and nanotechnology.

This is a preview of subscription content, log in via an institution.

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   189.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   249.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD   249.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. S. Morita, R. Wiesendanger, E. Meyer, Noncontact Atomic Force Microscopy (Springer, Berlin, 2002)

    Google Scholar 

  2. T. Eguchi, Y. Fujikawa, K. Akiyama, T. An, M. Ono, T. Hashimoto, Y. Morikawa, K. Terakura, T. Sakurai, M.G. Lagally, Y. Hasegawa, Phys. Rev. Lett. 93, 266102 (2004)

    Article  CAS  Google Scholar 

  3. Y. Sugimoto, M. Abe, S. Hirayama, S. Morita, Nanotechnology 17, 4235 (2006)

    Article  CAS  Google Scholar 

  4. L. Ottaviano, G. Profeta, L. Petaccia, C.B. Nacci, S. Santucci, Surf. Sci. 554, 109 (2004)

    Article  CAS  Google Scholar 

  5. F.J. Giessibl, S. Hembacher, H. Bielefeldt, J. Mannhart, Science 289, 422 (2000)

    Article  CAS  Google Scholar 

  6. S.T. Jemander, N. Lin, H.M. Zhang, R.I.G. Uhrberg, G.V. Hansson, Surf. Sci. 475, 181 (2001)

    Article  CAS  Google Scholar 

  7. W. Kaminski, P. Jelinek, R. Perez, F. Flores, J. Ortega, Appl. Surf. Sci. 234, 286 (2004)

    Article  CAS  Google Scholar 

  8. M. ˇ Svec, P. Jelinek, P. Shukrynau, C. Gonzalez, V. Chab, Phys. Rev. B 77, 125104 (2008)

    Article  CAS  Google Scholar 

  9. Y. Sugimoto, M. Abe, K. Yoshimoto, O. Custance, I. Yi, S. Morita, Appl. Surf. Sci. 241, 23 (2005)

    Article  CAS  Google Scholar 

  10. A. Ohiso, M. Hiragaki, K. Mizuta, Y. Sugimoto, M. Abe, S. Morita, e-J. Surf. Sci. Nanotechnol. 26, 79 (2008)

    Article  CAS  Google Scholar 

  11. N. Oyabu, O. Custance, I. Yi, Y. Sugawara, S. Morita, Phys. Rev. Lett. 90, 176102 (2003)

    Article  CAS  Google Scholar 

  12. N. Oyabu, Y. Sugimoto, M. Abe, O. Custance, S. Morita, Nanotechnology 16, S112 (2005)

    Article  CAS  Google Scholar 

  13. Y. Sugimoto, M. Abe, S. Hirayama, N. Oyabu, O. Custance, S. Morita, Nat. Mater. 4, 156 (2005)

    Article  Google Scholar 

  14. Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez, S. Morita, Science 322, 413 (2008)

    Article  CAS  Google Scholar 

  15. Y. Sugimoto, P. Jelinek, P. Pou, M. Abe, S. Morita, R. Perez, O. Custance, Phys. Rev. Lett. 98, 106104 (2007) and its additional information

    Google Scholar 

  16. M. Ternes, C.P. Lutz, C.F. Hirjibehedin, F.J. Giessibl, A.J. Heinrich, Science 319, 1066 (2008)

    Article  CAS  Google Scholar 

  17. T. Fukuma, K. Kobayashi, K. Matsushige, H. Yamada, Appl. Phys. Lett. 86, 193108 (2005)

    Article  CAS  Google Scholar 

  18. T. Fukuma, S.P. Jarvis, Rev. Sci. Instrum. 77, 043701 (2006)

    Article  CAS  Google Scholar 

  19. M. Herz, C. Schiller, F.J. Giessibl, J. Mannhart, Appl. Phys. Lett. 86, 153101 (2005)

    Article  CAS  Google Scholar 

  20. S. Hembacher, F.J. Giessibl, J. Mannhart, Science 305, 380 (2004)

    Article  CAS  Google Scholar 

  21. C. Barth, A.S. Foster, M. Reichling, A.L. Shluger, J. Phys. Condens. Matter. 13, 2061 (2001)

    Article  CAS  Google Scholar 

  22. G.H. Enevoldsen, A.S. Foster, M.C. Christensen, J.V. Lauritsen, F. Besenbacher, Phys. Rev. B 76, 205415 (2007)

    Article  CAS  Google Scholar 

  23. Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Perez, S. Morita, O. Custance, Nature 446, 64 (2007) 304

    Article  CAS  Google Scholar 

  24. U. Kaiser1, A. Schwarz, R. Wiesendanger, Nature 446, 522 (2007)

    Article  CAS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Graduate School of Engineering, Osaka University, 2-1, Yamada-Oka, Suita, Osaka, 565-0871, Japan

    Seizo Morita

Authors
  1. Seizo Morita
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Seizo Morita .

Editor information

Editors and Affiliations

  1. Graduate School of Engineering, Dept. of Electrical, Electronic and, Osaka University, Yamada-Oka 2-1, Suita, 565-0871, Japan

    Seizo Morita

  2. Institut für Experimentelle und, Angewandte Physik, Universität Regensburg, Universitätsstr. 31, Regensburg, 93053, Germany

    Franz J. Giessibl

  3. FB Physik, Inst. Angewandte Physik, Universität Hamburg, Jungiusstr. 11, Hamburg, 20355, Germany

    Roland Wiesendanger

Rights and permissions

Reprints and permissions

Copyright information

© 2009 Springer-Verlag Berlin Heidelberg

About this chapter

Cite this chapter

Morita, S. (2009). Introduction. In: Morita, S., Giessibl, F., Wiesendanger, R. (eds) Noncontact Atomic Force Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-01495-6_1

Download citation

Publish with us

Policies and ethics

Search

Navigation