Abstract
Electrochemical metallization of copper is used in microelectronics e.g., on-chip interconnection. The need for the fundamental understanding of the copper electrodeposition and the avoiding of ramified deposits, by exploration of especially the influence of the chemical–physical environment on the deposition, becomes more essential for the development of the microelectronic- and other related industries. Contrary to standard electrochemistry the electrodeposition from an ultrathin layer of electrolyte produces much more regular deposits, because of suppressed convection noises within this ultrathin layer. The details of the deposit morphology give information about how the copper deposition develops. It also hints at the influence of the local electric field and the local concentration filed on the morphology and the structure of copper deposits. This unique growth system may have significant implications on the pattern formation of many interfacial growth systems. Besides the use for basic scientific research, there are also perspectives for different applications in the field of parallel micro- and nano-wiring and the creation of periodical nanostructured films.
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Zhong, S., Koch, T., Wang, M., Zhang, M., Schimmel, T. (2009). Copper Electrodeposition from Ultrathin Layer of Electrolyte. In: Hahn, H., Sidorenko, A., Tiginyanu, I. (eds) Nanoscale Phenomena. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-00708-8_9
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DOI: https://doi.org/10.1007/978-3-642-00708-8_9
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