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Applications of Synchrotron Light to Scattering and Diffraction in Materials and Life Sciences pp 91–104Cite as

Fundaments of Soft Condensed Matter Scattering and Diffraction with Microfocus Techniques

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Part of the book series: Lecture Notes in Physics ((LNP,volume 776))

Abstract

Instrumentation, data analysis, radiation damage, and related issues of synchrotron radiation micro- and nanodiffraction techniques applied to soft condensed matter science are reviewed in this chapter. The current instrumental capabilities at the ESRF-ID13 beamline provide beam sizes from a few microns into the range of 100 nm. A further reduction to about 30 nm can be expected. The reduction of beam size is accompanied by an increase in beam divergence, which limits the accessible lower Q-limit as compared to SAXS cameras with optimized resolution due to low-divergence beams. The availability of recursive data reduction routines allows the extraction of structural information from large 2D detector data sets.

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Authors and Affiliations

  1. European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex, France

    C. Riekel, M. Burghammer, R. Davies, R. Gebhardt & D. Popov

Authors
  1. C. Riekel
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  2. M. Burghammer
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  3. R. Davies
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  4. R. Gebhardt
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  5. D. Popov
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Correspondence to C. Riekel .

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    Riekel, C., Burghammer, M., Davies, R., Gebhardt, R., Popov, D. (2009). Fundaments of Soft Condensed Matter Scattering and Diffraction with Microfocus Techniques. In: Gomez, M., Nogales, A., Garcia-Gutierrez, M., Ezquerra, T. (eds) Applications of Synchrotron Light to Scattering and Diffraction in Materials and Life Sciences. Lecture Notes in Physics, vol 776. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-95968-7_4

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    • DOI: https://doi.org/10.1007/978-3-540-95968-7_4

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    • Publisher Name: Springer, Berlin, Heidelberg

    • Print ISBN: 978-3-540-95967-0

    • Online ISBN: 978-3-540-95968-7

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