Abstract
Using the high peak brilliance of the X-ray Free-Electron Laser at Hamburg, we have studied the X-ray pulse induced transient optical reflectivity on GaAs and establish a novel tool for fs X-ray/optical cross-correlation
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Gahl, C. et al. (2009). X-ray induced transient optical reflectivity for fs-X-ray/optical cross-correlation at Free-Electron Lasers. In: Corkum, P., Silvestri, S., Nelson, K., Riedle, E., Schoenlein, R. (eds) Ultrafast Phenomena XVI. Springer Series in Chemical Physics, vol 92. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-95946-5_45
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DOI: https://doi.org/10.1007/978-3-540-95946-5_45
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