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X-ray induced transient optical reflectivity for fs-X-ray/optical cross-correlation at Free-Electron Lasers

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Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 92))

Abstract

Using the high peak brilliance of the X-ray Free-Electron Laser at Hamburg, we have studied the X-ray pulse induced transient optical reflectivity on GaAs and establish a novel tool for fs X-ray/optical cross-correlation

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References

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Correspondence to C. Gahl .

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© 2009 Springer-Verlag Berlin Heidelberg

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Gahl, C. et al. (2009). X-ray induced transient optical reflectivity for fs-X-ray/optical cross-correlation at Free-Electron Lasers. In: Corkum, P., Silvestri, S., Nelson, K., Riedle, E., Schoenlein, R. (eds) Ultrafast Phenomena XVI. Springer Series in Chemical Physics, vol 92. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-95946-5_45

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  • DOI: https://doi.org/10.1007/978-3-540-95946-5_45

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-95945-8

  • Online ISBN: 978-3-540-95946-5

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