Abstract
The binarization of wafer ID image is one of the key techniques of wafer ID recognition system and its results influence the accuracy of the segmentation of characters and their identification directly. The process of binarization of wafer ID is similar to that of the car license plate characters. However, due to some unique characteristics, such as the unsuccessive strokes of wafer ID, it is more difficult to make of binarization of wafer ID than the car license plate characters. In this paper, a wafer ID recognition scheme based on asterisk-shape filter is proposed to cope with the serious influence of uneven luminance. The testing results show that our proposed approach is efficient even in situations of overexposure and underexposure the wafer ID with high performance.
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© 2009 Springer-Verlag Berlin Heidelberg
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Wei-Chih, H., Tsan-Ying, Y., Kuan-Liang, C. (2009). A Binarization Approach for Wafer ID Based on Asterisk-Shape Filter. In: Chien, BC., Hong, TP. (eds) Opportunities and Challenges for Next-Generation Applied Intelligence. Studies in Computational Intelligence, vol 214. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-92814-0_6
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DOI: https://doi.org/10.1007/978-3-540-92814-0_6
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-92813-3
Online ISBN: 978-3-540-92814-0
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