Abstract
We have developed a methodology for unique identification of integrated circuits (ICs) that addresses untrusted fabrication and other security problems. The new method leverages nondestructive gate-level characterization of ICs post-manufacturing, revealing the hidden and unclonable uniqueness of each IC. The IC characterization uses the externally measured leakage currents for multiple input vectors. We have derived several optimization techniques for gate-level characterization. The probability of collision of IDs in presence of intra- and inter-chip correlations is computed. We also introduce a number of novel security and authentication protocols, such as hardware metering, challenge-based authentication and prevention of software piracy, that leverage the extraction of a unique ID for each IC. Experimental evaluations of the proposed approach on a large set of benchmark examples reveals its effectiveness even in presence of measurement errors.
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Alkabani, Y., Koushanfar, F., Kiyavash, N., Potkonjak, M. (2008). Trusted Integrated Circuits: A Nondestructive Hidden Characteristics Extraction Approach. In: Solanki, K., Sullivan, K., Madhow, U. (eds) Information Hiding. IH 2008. Lecture Notes in Computer Science, vol 5284. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-88961-8_8
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DOI: https://doi.org/10.1007/978-3-540-88961-8_8
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