Abstract
A variational approach is given for the effect from single-side modulation doping on low-temperature transport properties of the charge carriers confined in a square infinite quantum well (QW). We obtained analytic expressions which describe the doping effects on the carrier distribution in the well, their roughness-induced scattering in the in-plane and screening by them. The calculation of the transport lifetimes is performed for holes in a SiGe/Ge/SiGe square QW, and the result is found in quantitative agreement with recently measured dependence on experimental conditions such as channel width and carrier density.
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Tung, N.H., Quang, D.N., Hien, D.T. (2009). Effect of Single-Side Modulation Doping on Low-Temperature Transport Properties in Square Infinite Quantum Wells. In: Cat, D.T., Pucci, A., Wandelt, K. (eds) Physics and Engineering of New Materials. Springer Proceedings in Physics, vol 127. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-88201-5_2
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DOI: https://doi.org/10.1007/978-3-540-88201-5_2
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-88200-8
Online ISBN: 978-3-540-88201-5
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