Abstract
This paper investigates the relation between the level of detail (LoD) in UML models and defect density of the associated implementation. We propose LoD measures that are applicable to both class- and sequence diagrams. Based on empirical data from an industrial software project we have found that classes with higher LoD, calculated using sequence diagram LoD metrics, correlates with lower defect density. Overall, this paper discusses a novel and practical approach to measure LoD in UML models and describes its application to a significant industrial case study.
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References
Chidamber, S.R., Kemerer, C.F.: A metrics suite for object oriented design. IEEE Trans. Softw. Eng. 20(6), 476–493 (1994)
Gyimothy, T., Ferenc, R., Siket, I.: Empirical validation of object-oriented metrics on open source software for fault prediction. IEEE Trans. Softw. Eng. 31(10), 897–910 (2005)
Subramanyam, R., Krishnan, M.S.: Empirical analysis of ck metrics for object-oriented design complexity: Implications for software defects. IEEE Trans. Softw. Eng. 29(4), 297–310 (2003)
Brito e Abreu, F., Melo, W.: Evaluating the impact of object-oriented design on software quality. In: METRICS 1996: Proceedings of the 3rd International Software Metrics Symposium. IEEE Computer Society Press, Los Alamitos (1996)
Janes, A., Scotto, M., Pedrycz, W., Russo, B., Stefanovic, M., Succi, G.: Identification of defect-prone classes in telecommunication software systems using design metrics. Information Sciences 176(24), 3711–3734 (2006)
Succi, G., Pedrycz, W., Stefanovic, M., Miller, J.: Practical assessment of the models for identification of defect-prone classes in object-oriented commercial systems using design metrics. Journal of Systems and Software 65(1), 1–12 (2003)
El Emam, K., Melo, W., Machado, J.C.: The prediction of faulty classes using object-oriented design metrics. Journal of Systems and Software 56(1), 63–75 (2001)
Basili, V.R., Briand, L.C., Melo, W.L.: A validation of object-oriented design metrics as quality indicators. IEEE Trans. Softw. Eng. 22(10), 751–761 (1996)
Dobing, B., Parsons, J.: How UML is used. Commun. ACM 49(5), 109–113 (2006)
SDMetrics: The UML design quality metrics tool, http://www.sdmetrics.com
Chillarege, R., Kao, W.L., Condit, R.G.: Defect type and its impact on the growth curve. In: Proceedings of the 13th international conference on Software engineering, pp. 246–255. IEEE Computer Society Press, Los Alamitos (1991)
Chillarege, R., Bhandari, I.S., Chaar, J.K., Halliday, M.J., Moebus, D.S., Ray, B.K., Wong, M.Y.: Orthogonal defect classification-a concept for in-process measurements. IEEE Transactions on Software Engineering 18(11), 943–956 (1992)
IEEE: IEEE standard classification for software anomalies. IEEE Std 1044-1993 (1994)
Lange, C.F.J., Chaudron, M.R.V., Muskens, J.: Practice: UML software architecture and design description. IEEE Software 23(2), 40–46 (2006)
Nugroho, A., Chaudron, M.R.V.: Managing the quality of UML models in practice. In: Rech, J., Bunse, C. (eds.) Model-Driven Software Development: Integrating Quality Assurance. Idea Group Inc. (2008)
Nugroho, A., Chaudron, M.R.V.: A survey into the rigor of UML use and its perceived impact on quality and productivity. In: 2nd International Symposium of Empirical Software Engineering and Measurement (2008)
Briand, L.C., Labiche, Y., Penta, M.D., Yan-Bondoc, H.D.: An experimental investigation of formality in UML-based development. IEEE Transactions on Software Engineering 31(10), 833–849 (2005)
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Nugroho, A., Flaton, B., Chaudron, M.R.V. (2008). Empirical Analysis of the Relation between Level of Detail in UML Models and Defect Density. In: Czarnecki, K., Ober, I., Bruel, JM., Uhl, A., Völter, M. (eds) Model Driven Engineering Languages and Systems. MODELS 2008. Lecture Notes in Computer Science, vol 5301. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-87875-9_42
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DOI: https://doi.org/10.1007/978-3-540-87875-9_42
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-87874-2
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