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Microtensile Tests Using In Situ Atomic Force Microscopy

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Applied Scanning Probe Methods XII

Part of the book series: NanoScience and Technology ((NANO))

Abstract

In recent years a new field in the micromechanical characterization of materials has emerged. Researchers started to integrate atomic force microscopes (AFM) into microtensile tests. This allowed to investigate surface deformation of layers with thicknesses in the range of micrometers. In the first part of this article experiments on organic samples are presented followed by developments on anorganic specimens. In the second part of the paper latest developments at the Center of Mechanics of ETH Zurich are presented. The setup allows to monitor crack growth with micrometer resolution. At the same time forces can be measured in the millinewton range. Specimens are made from photodefinable polyimide. The stress-crack- length diagrams of two experiments are presented which enables to identify different stages of crack growth and therefore of fracture behaviour. Finally, possible extensions of the setup employing digital image correlation (DIC) are envisioned by analyzing the displacement field around the crack tip.

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Author information

Authors and Affiliations

  1. Department of Mechanical and Process Engineering, ETH Zentrum IMES – Institute of Mechanical Systems, 8092 Zürich, Switzerland

    Udo Lang & Jurg Dual

Authors
  1. Udo Lang
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  2. Jurg Dual
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Editors and Affiliations

  1. Nanoprobe Laboratory for Bio- & Nanotechnology & Biomimetics (NLB2), Ohio State University, 201 W. 19th Ave, Columbus, Ohio 43210-1142, USA

    Bharat Bhushan

  2. Universität Münster FB 16 Physikalisches Institut, Wilhelm-Klemm-Str. 10, 48149 Münster, Germany

    Harald Fuchs

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© 2009 Springer-Verlag Berlin Heidelberg

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Lang, U., Dual, J. (2009). Microtensile Tests Using In Situ Atomic Force Microscopy. In: Bhushan, B., Fuchs, H. (eds) Applied Scanning Probe Methods XII. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85039-7_8

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