Abstract
Section 7.1. To analyze test incidents and to find the real cause of defects in large software projects, a methodological approach is required. Orthogonal defect classification (ODC) and Ishikawa diagrams are proven methods to achieve this goal.
Section 7.2: Causal chains found in test projects are presented and explained.
Section 7.3. The most significant data-dependent testing issues are discussed in this section: database testing, automatic SQL tuning, key indicators in database testing, bi-temporality issues, the data state, and the causality violation.
Section 7.4 illustrates frequent causes of problems in large-scale software projects.
In Section 7.5, costs and risks related to software aging are examined.
Section 7.6 explains the steps required to investigate a technical problem, investigates the layering of technical processes, and gives advice when to deal with errors.
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© 2008 Springer-Verlag Berlin Heidelberg
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(2008). The Analysis of Defect Root Causes. In: The Testing Network. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-78504-0_7
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DOI: https://doi.org/10.1007/978-3-540-78504-0_7
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-78503-3
Online ISBN: 978-3-540-78504-0
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