Abstract
The performance of many electronic and optoelectronic devices critically depends on the structural quality and homogeneity of the base material, which is often an epitaxial film grown by either vapor-phase epitaxy (VPE) or liquid-phase epitaxy (LPE).
This chapter presents the state of the art in LPE growth of selected advanced materials:
-
1.
High-temperature superconductors
-
2.
Calcium gallium germanates (langasite-type materials)
-
3.
III–V wide-bandgap nitrides.
It is not the aim, herein, to present LPE growth of more traditional III–V semiconductors (Si, Ge, GaAs, GaP, InP, GaP) and garnets, which have already been described extensively in the literature since about 1960. Instead, some of the most relevant literature references are given in the historical overview, which also provides a very good insight into the potential of LPE growth of newer materials. Despite the fact that LPE growth has gained less attention over the past decades, mainly due to the development of VPE growth techniques, there is a silver lining which clearly indicates that the highest-quality epitaxial films, for most efficient electronic and optoelectronic devices, will ultimately be achieved from liquid-assisted or LPE-grown films.
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Abbreviations
- 2-D:
-
two-dimensional
- 3-D:
-
three-dimensional
- AFM:
-
atomic force microscopy
- ALE:
-
arbitrary Lagrangian Eulerian
- ALE:
-
atomic layer epitaxy
- CGG:
-
calcium gallium germanate
- CVD:
-
chemical vapor deposition
- DVD:
-
digital versatile disk
- ELO:
-
epitaxial lateral overgrowth
- FWHM:
-
full width at half-maximum
- HEMT:
-
high-electron-mobility transistor
- HTSC:
-
high-temperature superconductor
- HVPE:
-
halide vapor-phase epitaxy
- HVPE:
-
hydride vapor-phase epitaxy
- IR:
-
infrared
- LAGB:
-
low-angle grain boundary
- LAO:
-
LiAlO2
- LD:
-
laser diode
- LED:
-
light-emitting diode
- LEEBI:
-
low-energy electron-beam irradiation
- LG:
-
LiGaO2
- LGN:
-
La3Ga5.5Nb0.5O14
- LGO:
-
LaGaO3
- LGS:
-
La3Ga5SiO14
- LGT:
-
La3Ga5.5Ta0.5O14
- LPE:
-
liquid-phase epitaxy
- MBE:
-
molecular-beam epitaxy
- MOCVD:
-
metalorganic chemical vapor deposition
- MOCVD:
-
molecular chemical vapor deposition
- MOVPE:
-
metalorganic vapor-phase epitaxy
- NGO:
-
NdGaO3
- NdBCO:
-
NdBa2Cu3O7-x
- PCF:
-
primary crystallization field
- PCF:
-
protein crystal growth facility
- PVD:
-
physical vapor deposition
- RF:
-
radiofrequency
- SAW:
-
surface acoustical wave
- SIMS:
-
secondary-ion mass spectrometry
- TD:
-
Tokyo Denpa
- TD:
-
threading dislocation
- TSSG:
-
top-seeded solution growth
- UV:
-
ultraviolet
- VPE:
-
vapor-phase epitaxy
- XRD:
-
x-ray diffraction
- YBCO:
-
YBa2Cu3O7-x
- YIG:
-
yttrium iron garnet
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Klemenz Rivenbark, C.F. (2010). Liquid-Phase Epitaxy of Advanced Materials. In: Dhanaraj, G., Byrappa, K., Prasad, V., Dudley, M. (eds) Springer Handbook of Crystal Growth. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74761-1_31
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