The Long Trace Profiler (LTP) is the most commonly employed instrument for measuring grazing incidence optics used in synchrotron radiation. This is a direct slope measurement device, able to detect root mean square slope variations of the order of 0.1 μrad. It was originally developed at the Brookhaven National Laboratory in Upton, NY, but several custom modified devices are used at laboratories around the world. In this chapter the main principles as well as various modifications are described, in order to give a general overview of what is possible with such instruments.
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Rommeveaux, A., Thomasset, M., Cocco, D. (2008). The Long Trace Profilers. In: Erko, A., Idir, M., Krist, T., Michette, A.G. (eds) Modern Developments in X-Ray and Neutron Optics. Springer Series in optical science, vol 137. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74561-7_10
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