Abstract
The application of asynchronous circuit has been greatly restricted by reason of lacking effective technologies to test. Making use of the self-checking property of asynchronous control circuit, we may preferably solve this problem. In the paper, we put forward an improved, fail-stop David Cell, describe a way of designing self-checking asynchronous control circuits by the direct mapping technique, and propose the testing method for single stuck-at faults. The result shows that self-checking counterpart can be tested at normal operation speed and the area overhead is acceptable.
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Ruan, J., Wang, Z., Dai, K., Li, Y. (2007). Design and Test of Self-checking Asynchronous Control Circuit. In: Azémard, N., Svensson, L. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2007. Lecture Notes in Computer Science, vol 4644. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74442-9_31
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DOI: https://doi.org/10.1007/978-3-540-74442-9_31
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