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Applied Scanning Probe Methods VIII pp 1–29Cite as

Background-Free Apertureless Near-Field Optical Imaging

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Part of the book series: Nano Science and Technolgy ((NANO))

Abstract

The goal of this chapter is to review the theoretical background and the experimental techniques of apertureless scanning near-field optical microscopy (SNOM) artifact-free imaging. We describe the principles of apertureless SNOM, detailing the different detection schemes for artifact-free imaging: homodyne and heterodyne detection. Additionally, we detail the physical origin of the measured signals, describe optical artifacts, and discuss experimental techniques capable of artifact-free imaging. Finally, we provide an overview of the potential application of these techniques in materials science, nanophotonics, nanoplasmonics and soft-matter science.

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Author information

Authors and Affiliations

  1. Sezione Messina, CNR – Istituto per i Processi Chimico-Fisici, Via La Farina 237, 98123 , Messina, Italy

    Pietro Giuseppe Gucciardi

  2. Laboratoire de Spectrométrie Ionique et Moléculaire (LASIM), Université Claude Bernard – Lyon 1, 43 Boulevard du 11 Novembre 1918, 69622, Villeurbanne Cedex, France

    Guillaume Bachelier

  3. Technology Surface and Microanalysis Science Division (837), National Institute of Standards , 100 Bureau Drive , 20899-8372, Gaithersburg, MD, USA

    Stephan J. Stranick

  4. Dipartimento di Fisica “Enrico Fermi”, Università di Pisa, Largo Bruno Pontecorvo 3, 56127, Pisa, Italy

    Maria Allegrini

Authors
  1. Pietro Giuseppe Gucciardi
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  2. Guillaume Bachelier
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  3. Stephan J. Stranick
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  4. Maria Allegrini
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Editor information

Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, W390 Scott Laboratory, 201W. 19th Avenue, 43210-1142, Columbus, Ohio, USA

    Bharat Bhushan

  2. Institute of Physics, FB 16, University of Münster, Wilhelm-Klemm-Str. 10, 48149, Münster, Germany

    Harald Fuchs

  3. Advanced Institute of Science & Technology, School of Materials Science, 923-1292, Ishikawa, Japan

    Masahiko Tomitori

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Gucciardi, P., Bachelier, G., Stranick, S., Allegrini, M. (2008). Background-Free Apertureless Near-Field Optical Imaging. In: Bhushan, B., Fuchs, H., Tomitori, M. (eds) Applied Scanning Probe Methods VIII. Nano Science and Technolgy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74080-3_1

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