Abstract
In this paper the novel, miniaturized full-field optical extensometer for full-field in-plane displacement measurement is presented. It consists of two modules: illumination/detection module (IDM) and Measurement Head (MH) based on grating interferometry. In the paper we study the performance of IDM, which provides the object illumination beam and captures the output interferogram. The characterization of VCSEL comprises determination of polarization state, intensity distribution, coherence path length and shape of the wavefront after being collimated by beam forming optics. The detector matrix has been tested mainly in respect of the signal to noise ratio at various exposure times and its spatial uniformity of sensitivity.
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References
J. KręŠel, L. Sałbut, M. Kujawińska, “M(O)EMS-based integrated micro-interferometric system”, Proceedings of SPIE, Vol. 6348–22
K. Patorski, M. Kujawińska, L. Salbut, “Interferometria Laserowa z Automatyczną Analizą Obrazu”, Oficyna Wydawnicza PW, Warszawa (2005)
J. Kacperski, M. Kujawińska, “Multifunctional interferometric platform for static and dynamic MEMS measurement”, Proc. SPIE 5878, s. 64–73, 2005
L. Salbut, „Waveguide grating (moire) interferometer for in-plane displacement/ strain fields investigation“ Opt. Eng. 2002 41, 626–631
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© 2007 Springer-Verlag Berlin Heidelberg
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Kręšel, J., Kujawińska, M., Sałbut, L., Keränen, K. (2007). The studies of the illumination/detection module in Integrated Microinterferometric Extensometer. In: Jabłoński, R., Turkowski, M., Szewczyk, R. (eds) Recent Advances in Mechatronics. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-73956-2_126
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DOI: https://doi.org/10.1007/978-3-540-73956-2_126
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-73955-5
Online ISBN: 978-3-540-73956-2
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