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A Fast Construction of the Distance Graph Used for the Classification of Heterogeneous Electron Microscopic Projections

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Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 4538))

Abstract

It has been demonstrated that the difficult problem of classifying heterogeneous projection images, similar to those found in 3D electron microscopy (3D-EM) of macromolecules, can be successfully solved by finding an approximate Max k-Cut of an appropriately constructed weighted graph. Despite of the large size (thousands of nodes) of the graph and the theoretical computational complexity of finding even an approximate Max k-Cut, an algorithm has been proposed that finds a good (from the classification perspective) approximate solution within several minutes (running on a standard PC). However, the task of constructing the complete weighted graph (that represents an instance of the projection image classification problems) is computationally expensive. Due to the large number of edges, the computation of edge weights can take tens of hours for graphs containing several thousand nodes. We propose a method, which utilizes an early termination technique, to significantly reduce the computational cost of constructing such graphs. We compare, on synthetic data sets that resemble projection sets encountered in 3D-EM, the performance of our method with that of a brute-force approach and a method based on nearest neighbor search.

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Francisco Escolano Mario Vento

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© 2007 Springer-Verlag Berlin Heidelberg

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Kalinowski, M., Daurat, A., Herman, G.T. (2007). A Fast Construction of the Distance Graph Used for the Classification of Heterogeneous Electron Microscopic Projections. In: Escolano, F., Vento, M. (eds) Graph-Based Representations in Pattern Recognition. GbRPR 2007. Lecture Notes in Computer Science, vol 4538. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-72903-7_24

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  • DOI: https://doi.org/10.1007/978-3-540-72903-7_24

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-72902-0

  • Online ISBN: 978-3-540-72903-7

  • eBook Packages: Computer ScienceComputer Science (R0)

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