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Carbon-Nanotube Metrology

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Book cover Carbon Nanotubes

Part of the book series: Topics in Applied Physics ((TAP,volume 111))

Abstract

Scientific and industrial metrology provided tools for technological growth andinnovation, by fostering competitiveness and creating a favorable environment forscientific and industrial development. Every major country has its own metrologyinstitute to support companies in increasing their productivity and the quality oftheir goods and services. The fast development of carbon-nanotube science andapplications urged studies on metrology, standardization and industrial qualitycontrol. Development of protocols for the definition of sample parameters likestructural metrics, physical properties and stability are important for both researchand applications of single-, double- and multiwall carbon nanotubes. This workdiscusses some of the experimental techniques that are broadly used forcarbon-nanotube characterization, including scanning probe microscopy andspectroscopy, electron microscopy and diffraction, and optical spectroscopies, fromthe molecular level to bulk properties, addressing achievements, limitations anddirections where further research is needed for the development of standards andprotocols for metrology, standardization and industrial quality control of carbonnanotubes.

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Authors and Affiliations

  1. Departamento de Fsica, Universidade Federal de Minas Gerais (UFMG), 30.123-970, Belo Horizonte, MG, Brazil

    Ado Jorio

  2. Diviso de Metrologia de Materiais, Instituto Nacional de Metrologia,Normalizao e Qualidade Industrial (INMETRO), 25250-020, Duque de Caxias, RJ, Brazil

    Ado Jorio

  3. NanoMaterials Group, Laboratory of Physics and Center for NewMaterials (CNM), Helsinki University of Techology (HUT) and VTT Biotechnology, Espoo, Finland

    Esko Kauppinen

  4. Nanotechnology Research Institute, AIST, 1-1-1 Umezono, Ibaraki305-8568, Tsukuba, Japan

    Abdou Hassanien

Authors
  1. Ado Jorio
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  2. Esko Kauppinen
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  3. Abdou Hassanien
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Corresponding author

Correspondence to Ado Jorio .

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Editors and Affiliations

  1. Departamento de Física, Universidade Federal de Minas Gerais (UFMG), 30.123-970, Belo Horizonte, MG, Brazil

    Ado Jorio

  2. Francis Bitter Magnet Lab, Massachusetts Institute of Technology, 02139-4307, Cambridge, MA

    Gene Dresselhaus

  3. Department of Physics and Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 02139-4307, Cambridge, MA, USA

    Mildred S. Dresselhaus

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© 2007 Springer-Verlag Berlin Heidelberg

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Jorio, A., Kauppinen, E., Hassanien, A. (2007). Carbon-Nanotube Metrology. In: Jorio, A., Dresselhaus, G., Dresselhaus, M.S. (eds) Carbon Nanotubes. Topics in Applied Physics, vol 111. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-72865-8_3

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