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Device Stability and Radiation Hardness

  • Gerhard Lutz

Abstract

Reliable operation of semiconductor detectors requires insensitivity to environmental conditions such as humidity, temperature and working in atmospheric or vacuum conditions. The radiation to be measured may change the detector material and thus also the properties of the detector.

Keywords

Radiation Hardness Oxide Charge Device Stability Hole Capture Average Charge State 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2007

Authors and Affiliations

  • Gerhard Lutz
    • 1
  1. 1.Semiconductor Laboratory of the Max-Planck-Institutes for Physics and Extraterrestrial PhysicsMunichGermany

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