Abstract
Using a series of bi-layer samples, we show how Conversion Electron Mössbauer Spectroscopy (CEMS) and X-ray Backscatter Mössbauer Spectroscopy (XBS) can be done with the same experimental set up. The penetration depths of the K and L conversion electrons are measured as 51(6) and 330(240) nm, respectively, with relative contributions of 88(9) and 12(9)%. The penetration depth of the Fe-K α X-ray signal is determined to be 3.6(2) μm. As a demonstration we show data on surface damage effects in electropolished TRIP steels, and by comparing CEMS and XBS Mössbauer patterns we estimate the thickness of a damaged layer (created by sanding) to be 550(50) nm.
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Perry, L.K., Ryan, H., Gagnon, R. (2006). Studying surfaces and thin films using Mössbauer spectroscopy. In: Alp, E.E., Wynter, C.I. (eds) NASSAU 2006. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-71127-8_15
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DOI: https://doi.org/10.1007/978-3-540-71127-8_15
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