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A Fast Computation of Inter-class Overlap Measures Using Prototype Reduction Schemes

  • Conference paper
Book cover Advances in Artificial Intelligence (Canadian AI 2008)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 5032))

Abstract

In most Pattern Recognition (PR) applications, it is advantageous if the accuracy (or error rate) of the classifier can be evaluated or bounded prior to testing it in a real-life setting. It is also well known that if the two class-conditional distributions have a large overlapping volume, the classification accuracy is poor. This is because, if we intend to use the classification accuracy as a criterion for evaluating a PR system, the points within the overlapping volume tend to have less significance in determining the prototypes. Unfortunately, the computation of the indices which quantify the overlapping volume is expensive. In this vein, we propose a strategy of using a Prototype Reduction Scheme (PRS) to approximately compute the latter. In this paper, we show that by completely discarding the points not included by the PRS, we can obtain a reduced set of sample points, using which, in turn, the measures for the overlapping volume can be computed. The value of the corresponding figures is comparable to those obtained with the original training set (i.e., the one which considers all the data points) even though the computations required to obtain the prototypes and the corresponding measures are significantly less. The proposed method has been rigorously tested on artificial and real-life data sets, and the results obtained are, in our opinion, quite impressive - sometimes faster by two orders of magnitude.

The second author was partially supported by NSERC, the Natural Sciences and Engineering Research Council of Canada. This work was generously supported by the Korea Research Foundation Grant funded by the Korea Government(MOEHRD-KRF-2007-313-D00714).

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Authors and Affiliations

  1. Dept. of Computer Science and Engineering, Myongji University, Yongin, 449-728, South Korea

    Sang-Woon Kim

  2. School of Computer Science, Carleton University, Ottawa, Canada

    B. John Oommen

Authors
  1. Sang-Woon Kim
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  2. B. John Oommen
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Sabine Bergler

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Kim, SW., Oommen, B.J. (2008). A Fast Computation of Inter-class Overlap Measures Using Prototype Reduction Schemes. In: Bergler, S. (eds) Advances in Artificial Intelligence. Canadian AI 2008. Lecture Notes in Computer Science(), vol 5032. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-68825-9_17

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  • DOI: https://doi.org/10.1007/978-3-540-68825-9_17

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-68821-1

  • Online ISBN: 978-3-540-68825-9

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