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Electron Optics of Imaging Energy Filters

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Energy-Filtering Transmission Electron Microscopy

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 71))

Abstract

Inelastic scattering always occurs when charged particles interact with the atoms of an object. Since the inelastic process is delocalized the image formed by the inelastically scattered electrons does not contain much information about the atomic structure of the specimen. Nevertheless, the inelastically scattered electrons do carry information about its elemental composition on a nanometre scale.

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Authors
  1. Harald Rose
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  2. Dieter Krahl
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Editor information

Editors and Affiliations

  1. Physikalisches Institut, Universität Münster, Wilhelm-Klemm-Straße 10, D-48149, Münster, Germany

    Ludwig Reimer

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© 1995 Springer-Verlag Berlin Heidelberg

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Rose, H., Krahl, D. (1995). Electron Optics of Imaging Energy Filters. In: Reimer, L. (eds) Energy-Filtering Transmission Electron Microscopy. Springer Series in Optical Sciences, vol 71. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-48995-5_2

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  • DOI: https://doi.org/10.1007/978-3-540-48995-5_2

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-14055-0

  • Online ISBN: 978-3-540-48995-5

  • eBook Packages: Springer Book Archive

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