Abstract
In this chapter, various aspects of the actual film structure will be explored. These topics include the different possible structures of heteroepitaxial films and the precise determination of atomic positions. Furthermore, the characterization of film morphology will be treated. This subject has already been covered to some extent in the last chapter. In Sect. 3.2, it will be demonstrated that a single technique, namely low-energy electron diffraction, can give a wealth of information about the structure of ultrathin films.
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Wuttig, M., Liu, X. Structure of Ultrathin Films. In: Ultrathin Metal Films. Springer Tracts in Modern Physics, vol 206. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-48673-2_3
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DOI: https://doi.org/10.1007/978-3-540-48673-2_3
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