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Photoacoustic and Photothermal Phenomena II pp 133–137Cite as

Measurements of the Absorption Distribution of Optical Thin Films by Scanning Photothermal Microscopy

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Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 62))

Abstract

A scanning photothermal microscope controlled by a closed-circuit computer system is presented, in which the pump and probe beams are auto-adjusted together on the surface of a thin film. The absorption distribution of laser-damaged films is obtained correctly.

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References

  1. A. Hordvik: Appl. Opt. 16, 2827 (1977)

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  2. J. C. Murphy, L. C. Aamodt: Appl. Phys. Lett. 38, 196 (1981)

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  3. W.B. Jackson, N.M. Amer, A.C. Boccara, D. Fournier: Appl. Opt. 20, 1333 (1981)

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Author information

Authors and Affiliations

  1. Optical Engineering Department, Zhejiang University, Hangzhou, People’s Rep.of China

    Huang Xue-bo & Chen Wen-bin

Authors
  1. Huang Xue-bo
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  2. Chen Wen-bin
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Editor information

Editors and Affiliations

  1. Materials Science Department and Applied Physics Laboratory, The Johns Hopkins University, Laurel, MD, 20723-6099, USA

    John C. Murphy

  2. Applied Physics Laboratory, The Johns Hopkins University, Laurel, MD, 20723-6099, USA

    Jane W. Maclachlan Spicer Ph. D.  & Leonard C. Aamodt Ph. D.  & 

  3. School of Engineering and Applied Science, Department of Mechanical and Aerospace Engineering, Princeton University, Princeton, NJ, 08544-5263, USA

    Barrie S. H. Royce

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© 1990 Springer-Verlag Berlin Heidelberg

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Cite this paper

Xue-bo, H., Wen-bin, C. (1990). Measurements of the Absorption Distribution of Optical Thin Films by Scanning Photothermal Microscopy. In: Murphy, J.C., Spicer, J.W.M., Aamodt, L.C., Royce, B.S.H. (eds) Photoacoustic and Photothermal Phenomena II. Springer Series in Optical Sciences, vol 62. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-46972-8_33

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  • DOI: https://doi.org/10.1007/978-3-540-46972-8_33

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-13795-6

  • Online ISBN: 978-3-540-46972-8

  • eBook Packages: Springer Book Archive

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