Abstract
The interaction of surface plasmons (SP) with surface roughness has been studied by a photoacoustic method and a comparison of the angular resonance halfwidth with the halfwidth of angular ATR and forward scattering indicates that surface roughness of Ag evaporated films contribute equally to scattering of SP into other SP and into photons.
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References
Inagaki, T., Kagami, K. & Arakawa, E.T. Phys. Rev. B 24:3644 (1981).
Talaat, H., Darby, H., 1983. Ultrasonic symp.: 700–703.
Rothenhauser B., Rabe, J., Korpiun, P. & Knoll, W. Surf. Sci. 137:373–383 (1984).
Maradudin, A.A. In “Surface Polaritons” edited by U.M. Agranovich & D.L. Mills, North Holland Publishing Co., New York (1982): Chapter 10.
Raether, H., Surf. Sci 125:624–634 (1982).
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© 1990 Springer-Verlag Berlin Heidelberg
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Negm, S., Talaat, H. (1990). Photoacoustic-Attenuated Total Reflection Study of Surface Roughness in Thin Metal Films. In: Murphy, J.C., Spicer, J.W.M., Aamodt, L.C., Royce, B.S.H. (eds) Photoacoustic and Photothermal Phenomena II. Springer Series in Optical Sciences, vol 62. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-46972-8_29
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DOI: https://doi.org/10.1007/978-3-540-46972-8_29
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-13795-6
Online ISBN: 978-3-540-46972-8
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