Abstract
A quantitative analysis of pulsed photothermal interferometry is presented. Experimental results showing the influence of coating thickness, optical spot size, beam non-uniformity and sample translucency are included.
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P. Cielo, R. Lewak, X. Maldague, M. Lamontagne: CSNDT Jour. April p30 (1986).
D.P. Almond, P.M. Patel, I.M. Pickup and H. Reiter: NDT Int. 18(1) pl7 (1985).
J.C. Murphy, L.C. Aamodt, G.C. Wetsel: Rev. of Prog, in QNDE 6A p277 (1987).
J.C. Murphy, J.W. Maclachlan, L.C. Aamodt: Rev. Prog, in QNDE 7A p245 (1988)
C.A. Bennett and R.R. Patty: Appl Opt 21 p107 (1982).
P.M Patel, DP. Almond and H. Reiter: Appl. Phys. B 43, 9–15 (1987).
S.K. Lau, D.P. Almond and P.M Patel: “Numerical Analysis of Transient...”; Submitted for 6th Int.Conf.Photoacoustics (1989).
W.W. Duley: Laser Processing and Analysis of Materials, 69–111 (1983).
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© 1990 Springer-Verlag Berlin Heidelberg
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Lau, S.K., Almond, D.P., Patel, P.M. (1990). Transient Thermal Wave Techniques for the Characterisation of Surface Coatings. In: Murphy, J.C., Spicer, J.W.M., Aamodt, L.C., Royce, B.S.H. (eds) Photoacoustic and Photothermal Phenomena II. Springer Series in Optical Sciences, vol 62. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-46972-8_17
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DOI: https://doi.org/10.1007/978-3-540-46972-8_17
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-13795-6
Online ISBN: 978-3-540-46972-8
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