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X-Ray Tomographic Microscopy

  • Conference paper
X-Ray Microscopy III

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 67))

Abstract

By making consistent use of the unique properties of synchrotron radiation it will be possible to push the resolution limit of X-ray tomography down to the sub-micron level. As exemplary steps of this development, the nondestructive 3-D imaging of alloy precipitates in Al, the imaging of the catalytic material in a supported catalyst, and the use of x-ray optical magnification are described.

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References

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Author information

Authors and Affiliations

  1. Institute of Physics, University of Dortmund, Postfach 500 500, W-4600, Dortmund 50, Fed. Rep. of Germany

    U. Bonse, R. Nußhardt & F. Busch

  2. Lawrence Livermore National Laboratory, University of California, Livermore, CA, 94550, USA

    J. H. Kinney & R. A. Saroyan

  3. Sandia National Laboratory, Livermore, CA, 94550, USA

    M. C. Nichols

Authors
  1. U. Bonse
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  2. R. Nußhardt
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  3. F. Busch
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  4. J. H. Kinney
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  5. R. A. Saroyan
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  6. M. C. Nichols
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Editor information

Editors and Affiliations

  1. Physics Department, King’s College London, The Strand, WC2R 2LS, London, UK

    Alan G. Michette Ph. D. , Graeme R. Morrison Ph. D.  & Chistopher J. Buckley Ph. D. ,  & 

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© 1992 Springer-Verlag Berlin Heidelberg

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Bonse, U., Nußhardt, R., Busch, F., Kinney, J.H., Saroyan, R.A., Nichols, M.C. (1992). X-Ray Tomographic Microscopy. In: Michette, A.G., Morrison, G.R., Buckley, C.J. (eds) X-Ray Microscopy III. Springer Series in Optical Sciences, vol 67. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-46887-5_39

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  • DOI: https://doi.org/10.1007/978-3-540-46887-5_39

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-13894-6

  • Online ISBN: 978-3-540-46887-5

  • eBook Packages: Springer Book Archive

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