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A Plasma Source for an Imaging X-Ray Microscope

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X-Ray Microscopy III

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 67))

Abstract

Pinch plasmas are sources of high brilliance for soft x-rays in the wavelength range from λ = 0.1 nm to 20 nm. A plasma focus device emitting line radiation of hydrogen-like nitrogen (N VII) at λ = 2.5 nm into the water window region has been developed as a source for a laboratory imaging x-ray microscope. Several diagnostic methods are applied to measure and maximize the brilliance of the line emission of the source. With an x-ray optic developed at Göttingen pictures with 0.1–0.2 µm lateral resolution have been taken.

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References

  1. G.Schmahl, B. Niemann, D. Rudolph, M. Diehl, J. Thieme, W. Neff, R. Holz, F. Richter, G. Herziger: “A laboratory x-ray microscope with a plasma x-ray source,” this volume

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  5. R. Lebert: “Pinchplasmen als gepulste Röntgenquellen hoher spektrale Strahldichte,” Ph. D. thesis (RWTH Aachen, 1990 )

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© 1992 Springer-Verlag Berlin Heidelberg

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Lebert, R., Holz, R., Rothweiler, D., Richter, F., Neff, W. (1992). A Plasma Source for an Imaging X-Ray Microscope. In: Michette, A.G., Morrison, G.R., Buckley, C.J. (eds) X-Ray Microscopy III. Springer Series in Optical Sciences, vol 67. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-46887-5_11

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  • DOI: https://doi.org/10.1007/978-3-540-46887-5_11

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-13894-6

  • Online ISBN: 978-3-540-46887-5

  • eBook Packages: Springer Book Archive

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