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Introduction to Soft X-Ray Microscopy

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X-Ray Microscopy III

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 67))

Abstract

A brief survey is given of the physical principles on which soft X-ray imaging depends. The present and emerging situation is reviewed concerning sources of soft X-rays, optical systems and image contrast. Thus is provided a basis from which both to assess X-ray microscopy against other methods and to define unique applications for X-ray imaging.

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Author information

Authors and Affiliations

  1. Wheatstone Physics Laboratory, King’s College London, Strand, London, WC2R 2LS, UK

    R. E. Burge

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  1. R. E. Burge
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Editor information

Editors and Affiliations

  1. Physics Department, King’s College London, The Strand, WC2R 2LS, London, UK

    Alan G. Michette Ph. D. , Graeme R. Morrison Ph. D.  & Chistopher J. Buckley Ph. D. ,  & 

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© 1992 Springer-Verlag Berlin Heidelberg

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Burge, R.E. (1992). Introduction to Soft X-Ray Microscopy. In: Michette, A.G., Morrison, G.R., Buckley, C.J. (eds) X-Ray Microscopy III. Springer Series in Optical Sciences, vol 67. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-46887-5_1

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  • DOI: https://doi.org/10.1007/978-3-540-46887-5_1

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-13894-6

  • Online ISBN: 978-3-540-46887-5

  • eBook Packages: Springer Book Archive

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