Abstract
Recent developments in near-field optical microscopy have made it possible to obtain optical images with nanometer-scale spatial resolution by scanning a fiber probe with a sub-wavelength aperture [1]. In attempts to improve performance in spatially resolved spectroscopy, a serious problem of the fiber probe is its low throughput (in the case of illumination-mode operation, the throughput is defined as the ratio of the output light power at the apex to the incident light power coupled into the fiber). The essential cause of the low throughput is the guiding loss along the metallized tapered core. Based on a mode analysis of the tapered core, we review our work to realize high-throughput probes.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
M. Ohtsu (ed.), Near-Field Nano/Atom Optics and Technology (Springer, Tokyo 1998)
L. Novotny, C. Hafner: Phys. Rev. E 50, 4094 (1994)
E.D. Palik (ed.), Handbook of Optical Constants of Solids (Academic Press, San Diego 1985)
T. Yatsui, M. Kourogi, M. Ohtsu: Appl. Phys. Lett. 71, 1756 (1997)
T. Pangaribun, K. Yamada, S. Jiang, H. Ohsawa, M. Ohtsu: Jpn. J. Appl. Phys. 31, L1302 (1992)
G.A. Valaskovic, M. Holton, G.H. Morrison: Appl. Opt.34 1215 (1995)
T. Yatsui, M. Kourogi, M. Ohtsu: Appl. Phys. Lett. 73, 2090 (1998)
Y. Inoue, S. Kawata: Opt. Lett. 19, 159 (1994)
D. Marcuse: Light Transmission Optics, 2nd edn. Chap. 10 (Krieger, Malabar 1982)
A. Sommerfeld: Optics, Chap. VI, 39 (Academic Press, New York 1954)
S. Mononobe, M. Naya, T. Saiki, M. Ohtsu: Appl. Opt.36 1496 (1997)
H.U. Danzebrink, T. Dziomba, T. Sulzbach, O. Ohlsson, C. Lehrer, L. Frey: J. Microscopy 194, 335 (1999)
T.R. Anthony: J. Appl. Phys. 58, 1240 (1998)
F. Yonezawa (ed.), Fundamental Physics of Amorphous Semiconductors, 104 (Springer, Berlin Heidelberg New York 1981)
K. Tanaka: J. Non-Crys. Solids 59 & 60925 (1993)
B.W. Corb, W.D. Wei, B.L. Averbach: J. Non-Crys. Solids 53 29 (1994)
T. Yatsui, M. Kourogi, K. Tsutsui, J. Takahashi, M. Ohtsu: Opt. Lett. 25, 1279 (2000)
J. Tominaga, T. Nakano, N. Atoda: Appl. Phys. Lett.73 2078 (1998)
H. Yoshikawa, Y. Andoh, M. Yamamoto, K. Fukuzawa, T. Tamamura, T. Ohkubo: Opt. Lett. 25, 67 (2000)
F. Isshiki, K. Ito, S. Hosaka: Appl. Phys. Lett.76 804 (2000)
Y.J. Kim, K. Kurihara, K. Suzuki, M. Nomura, S. Mitsugi, M. Chiba, K. Goto: Jpn. J. Appl. Phys. 39, 1538 (2000)
T. Yatsui, M. Kourogi, K. Tsutsui, J. Takahashi, M. Ohtsu: In: Proc. SPIE 3791 (1999) p. 76
D.W. Pohl: IBM J. Res. Dev.39 701 (1995)
M. Yanagisawa, A. Sato, K. Ajiki, F. Watanabe: In: Tribology of Contact/NearContact Recording for Ultra High Density Magnetic Storage. ed. by C.S. Bhatia, A.K. Menon, TRIB-6 (American Society of Mechanical Engineers, New York, 1996) p. 25
M. Ashino, M. Ohtsu: Appl. Phys. Lett. 72, 1299 (1998)
T. Matsumoto, T. Ichimura, T. Yatsui, M. Kourogi, T. Saiki, M. Ohtsu: Opt. Rev. 5, 369 (1998)
S. Mononobe, T. Saiki, T. Suzuki, S. Koshihara, M. Ohtsu: Opt. Commun.146 45 (1998)
T. Yatsui, M. Kourogi, M. Ohtsu: In: Technical Digest of Quantum Electronics and Laser Science Conference (2001) p. 79
K. Kurihara, M. Ohtsu, T. Yoshida, T. Abe, H. Hisamoto, K. Suzuki: Anal. Chem. 71, 3558 (1999)
Y. Yamamoto, G.-H. Lee, K. Matsuda, T. Shimizu, M. Kourogi, M. Ohtsu: Opt. Rev. 7, 486 (2000)
T. Saiki, K. Nishi, M. Ohtsu: Jpn. J. Appl. Phys. 37, 1638 (1998)
H. Fukuda, Y. Kadota, M. Ohtsu: Jpn. J. Appl. Phys.38 L571 (1999)
Y. Narita, T. Tadokoro, T. Ikeda, T. Saiki, S. Mononobe, M. Ohtsu: Appl. Spectro. 52, 1141 (1998)
V.V. Polonski, Y. Yamamoto, M. Kourogi, H. Fukuda, M. Ohtsu: J. Microscopy 194, 545 (1999)
Y. Yamamoto, M. Kourogi, M. Ohtsu, V. Polonski, G.-H. Lee: Appl. Phys. Lett. 76, 2173 (2000)
M. Ohtsu, K. Kobayashi, H. Ito, G.-H. Lee: Proc. IEEE 88, 1499 (2000)
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2003 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Yatsui, T., Ohtsu, M. (2003). High-Throughput Probes for Near-Field Optics and Their Applications. In: Ohtsu, M. (eds) Progress in Nano-Electro-Optics I. Springer Series in Optical Sciences, vol 86. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-46023-7_1
Download citation
DOI: https://doi.org/10.1007/978-3-540-46023-7_1
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-07801-9
Online ISBN: 978-3-540-46023-7
eBook Packages: Springer Book Archive