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Nano-Optics pp 151–190Cite as

Near-Field Imaging of Molecules and Thin Films

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Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 84))

Abstract

Characterization of materials on a nanometer scale becomes more important and indispensable year by year [1]. This is due to the development of new materials whose properties and functions are related to the structure and size of materials of the order of nanometers [2]. In this chapter, we will report our recent work on scanning near-field optical microscopy (SNOM [3]), or near-field scanning optical microscopy (NSOM [4]) in connection with chemistry and materials science. This work has been mainly carried out and developed in this project. In the first section, we describe some research into SNOM itself for studies of a variety of chemistries and materials.

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Authors
  1. M. Fujihira
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  2. S. Itoh
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  3. A. Takahara
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  4. O. Karthaus
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  5. S. Okazaki
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  6. K. Kajikawa
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Editor information

Editors and Affiliations

  1. Department of Applied Physics, Osaka University, 565-0871, Suita, Osaka, Japan

    Satoshi Kawata

  2. Tokyo Institute of Technology, 4259 Nagatuda, Midori-ku, 226-8502, Yokohama, Japan

    Motoichi Ohtsu

  3. Department of Chemistry and Biochemistry, Graduate School of Engineering, Kyushu University, Japan

    Masahiro Irie

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© 2002 Springer-Verlag Berlin Heidelberg

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Fujihira, M., Itoh, S., Takahara, A., Karthaus, O., Okazaki, S., Kajikawa, K. (2002). Near-Field Imaging of Molecules and Thin Films. In: Kawata, S., Ohtsu, M., Irie, M. (eds) Nano-Optics. Springer Series in Optical Sciences, vol 84. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-45273-7_7

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  • DOI: https://doi.org/10.1007/978-3-540-45273-7_7

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-07527-8

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