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Zincblende-Structure Materials (III–V)

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Infrared Ellipsometry on Semiconductor Layer Structures

Part of the book series: Springer Tracts in Modern Physics ((STMP,volume 209))

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Abstract

The following chapters will provide different examples including various semiconductor materials of contemporary interest and with diverse properties, where different layer structure situations will be addressed.

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Schubert, M. Zincblende-Structure Materials (III–V). In: Infrared Ellipsometry on Semiconductor Layer Structures. Springer Tracts in Modern Physics, vol 209. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-44701-6_6

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  • DOI: https://doi.org/10.1007/978-3-540-44701-6_6

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-23249-0

  • Online ISBN: 978-3-540-44701-6

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