Abstract
The following chapters will provide different examples including various semiconductor materials of contemporary interest and with diverse properties, where different layer structure situations will be addressed.
Preview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Rights and permissions
About this chapter
Cite this chapter
Schubert, M. Zincblende-Structure Materials (III–V). In: Infrared Ellipsometry on Semiconductor Layer Structures. Springer Tracts in Modern Physics, vol 209. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-44701-6_6
Download citation
DOI: https://doi.org/10.1007/978-3-540-44701-6_6
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-23249-0
Online ISBN: 978-3-540-44701-6
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)